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• W4284692776 endingPage "11025" @default.
• W4284692776 startingPage "11016" @default.
• W4284692776 abstract "Understanding the degradation mechanisms of negative electrodes based on nanoparticles like silicon is key for developing solutions against active material cracking, pulverization, or extensive growth of the solid electrolyte interphase (SEI). Scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX) are common ex situ methods for post mortem analysis of lithium (ion) battery materials. Beyond that, in situ/operando methods provide more accurate insights but require specially designed cells and electrolytes with a high evaporation temperature. This study combines aspects of in situ and ex situ SEM/EDX measurements to enable detailed insights on the degradation mechanisms of silicon nanoparticle-based electrodes during charge/discharge cycling. Therein, a protective quasi in situ environment was ensured by handling electrodes of repeatedly disassembled cells under an inert atmosphere and performing a same-spot analysis by SEM and EDX in the pristine state and after formation and subsequent cycles. This so-called quasi in situ analysis allowed accurate tracking of the degradation mechanisms such as irreversible expansion, cracking, and pulverization of active material particles and evolution of the SEI. Thus, extensive irreversible volume expansion of silicon nanoparticles was detected during charge/discharge cycling at low C rates, while higher C rates facilitated pulverization. Furthermore, EDX analysis revealed pronounced SEI growth at conductive additive-rich areas." @default.
• W4284692776 created "2022-07-08" @default.
• W4284692776 creator A5000203192 @default.
• W4284692776 creator A5028547517 @default.
• W4284692776 creator A5080085035 @default.
• W4284692776 date "2022-07-05" @default.
• W4284692776 modified "2023-10-13" @default.
• W4284692776 title "Visualization of Degradation Mechanisms of Negative Electrodes Based on Silicon Nanoparticles in Lithium-Ion Batteries via Quasi In Situ Scanning Electron Microscopy and Energy-Dispersive X-ray Spectroscopy" @default.
• W4284692776 cites W1985512598 @default.
• W4284692776 cites W1999601020 @default.
• W4284692776 cites W2001894021 @default.
• W4284692776 cites W2003080230 @default.
• W4284692776 cites W2017908888 @default.
• W4284692776 cites W2018657387 @default.
• W4284692776 cites W2021435259 @default.
• W4284692776 cites W2021575166 @default.
• W4284692776 cites W2045212019 @default.
• W4284692776 cites W2050789116 @default.
• W4284692776 cites W2054427445 @default.
• W4284692776 cites W2064079552 @default.
• W4284692776 cites W2066534681 @default.
• W4284692776 cites W2090810785 @default.
• W4284692776 cites W2099643004 @default.
• W4284692776 cites W2122164055 @default.
• W4284692776 cites W2124043346 @default.
• W4284692776 cites W2139562458 @default.
• W4284692776 cites W2147786599 @default.
• W4284692776 cites W2156001664 @default.
• W4284692776 cites W2158006396 @default.
• W4284692776 cites W2235781334 @default.
• W4284692776 cites W2255051553 @default.
• W4284692776 cites W2320616659 @default.
• W4284692776 cites W2344592845 @default.
• W4284692776 cites W2475467307 @default.
• W4284692776 cites W2545939618 @default.
• W4284692776 cites W2757352379 @default.
• W4284692776 cites W2758610127 @default.
• W4284692776 cites W2777636086 @default.
• W4284692776 cites W2784212954 @default.
• W4284692776 cites W2787742631 @default.
• W4284692776 cites W2889544647 @default.
• W4284692776 cites W2910811948 @default.
• W4284692776 cites W2915061185 @default.
• W4284692776 cites W2921340759 @default.
• W4284692776 cites W2921645931 @default.
• W4284692776 cites W2945331209 @default.
• W4284692776 cites W2954876852 @default.
• W4284692776 cites W2956113867 @default.
• W4284692776 cites W2970386804 @default.
• W4284692776 cites W2972878444 @default.
• W4284692776 cites W2975137994 @default.
• W4284692776 cites W2984942060 @default.
• W4284692776 cites W2991036799 @default.
• W4284692776 cites W2998285876 @default.
• W4284692776 cites W3005459336 @default.
• W4284692776 cites W3011845981 @default.
• W4284692776 cites W3013092912 @default.
• W4284692776 cites W3042440756 @default.
• W4284692776 cites W3094001154 @default.
• W4284692776 cites W3123015351 @default.
• W4284692776 cites W3129148582 @default.
• W4284692776 cites W3139422454 @default.
• W4284692776 cites W3148462881 @default.
• W4284692776 cites W3161897699 @default.
• W4284692776 cites W3164192170 @default.
• W4284692776 cites W3187623858 @default.
• W4284692776 cites W4210928659 @default.
• W4284692776 cites W4248540693 @default.
• W4284692776 doi "https://doi.org/10.1021/acs.jpcc.2c03294" @default.
• W4284692776 hasPublicationYear "2022" @default.
• W4284692776 type Work @default.
• W4284692776 citedByCount "7" @default.
• W4284692776 countsByYear W42846927762022 @default.
• W4284692776 countsByYear W42846927762023 @default.
• W4284692776 crossrefType "journal-article" @default.
• W4284692776 hasAuthorship W4284692776A5000203192 @default.
• W4284692776 hasAuthorship W4284692776A5028547517 @default.
• W4284692776 hasAuthorship W4284692776A5080085035 @default.
• W4284692776 hasConcept C113196181 @default.
• W4284692776 hasConcept C121332964 @default.
• W4284692776 hasConcept C127413603 @default.
• W4284692776 hasConcept C134018914 @default.
• W4284692776 hasConcept C147438087 @default.
• W4284692776 hasConcept C147789679 @default.
• W4284692776 hasConcept C155672457 @default.
• W4284692776 hasConcept C159985019 @default.
• W4284692776 hasConcept C163258240 @default.
• W4284692776 hasConcept C171250308 @default.
• W4284692776 hasConcept C17525397 @default.
• W4284692776 hasConcept C185592680 @default.
• W4284692776 hasConcept C192562407 @default.
• W4284692776 hasConcept C26771246 @default.
• W4284692776 hasConcept C2778541603 @default.
• W4284692776 hasConcept C2779197387 @default.
• W4284692776 hasConcept C42360764 @default.
• W4284692776 hasConcept C43617362 @default.
• W4284692776 hasConcept C49040817 @default.
• W4284692776 hasConcept C544956773 @default.

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