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- W4285103285 abstract "Solder joints in electronic assemblies are frequently exposed to thermal cycling environments in their service life or during accelerated life testing where temperature variations occur from very low to high temperature. Due to the CTE mismatches of the assembly materials, cyclic temperature leads to damage accumulation due to shear fatigue in the solder joints. In addition, dwell periods at the high temperature extremes will cause thermal aging phenomena and additional microstructural evolution and material property degradation. Further aging effects can occur during the ramp periods between the low and high temperature extremes.While changes in solder materials during aging have been examined in detail in prior studies, there have been limited studies examining material evolution occurring during other thermal exposures such as thermal cycling and thermal shock. In our recent papers, the mechanical behavior evolutions occurring in SAC305 and SAC+3%Bi (SAC_Q) lead free solders have been characterized for up to 20 days of exposure to four different thermal profiles including isothermal aging, slow thermal cycling, thermal shock, and thermal ramping. The degradations in the mechanical properties (modulus, UTS, yield strength) were observed for both miniature bulk samples and solder joints, and then the results were compared for the different exposure profiles. For both bulk samples and joints, the largest changes were observed for the slow thermal cycling profile. In addition, the changes in the SAC+3%Bi solder samples were much smaller than those experienced in the SAC305 solder samples for all of the considered thermal profiles.In the current investigation, we have extended our prior study to examine several different SAC+Bi solder alloys with various bismuth contents. In particular, a family of SAC+Bi alloys with 1%, 2%, and 3% Bi were studied with four different thermal exposure profiles (isothermal aging, slow thermal cycling, thermal shock, and thermal ramping). The primary objective of this study was to determine how much bismuth is needed in the lead-free alloy to mitigate microstructure and material property evolutions during thermal exposures. Use of lower Bi content can lower solder cost and also increase reliability in high strain rate loadings such as shock/drop/vibration.Uniaxial miniature bulk specimens were prepared for the three SAC+Bi alloys using a controlled reflow profile. After fabrication, the samples were then preconditioned by thermal exposure under stress-free conditions for various durations up to 100 days. Several thermal exposure profiles from -40 C to 125 C were examined including: (1) isothermal aging at the high temperature extreme (aging), (2) 150 minute cycles with 45 minutes ramps and 30 minutes dwells (slow thermal cycling), (3) air-to-air thermal shock exposures with 30 minutes dwells and near instantaneous ramps (thermal shock), and (4) 90 minute cycles with 45 minutes ramps and 0 minutes dwells (thermal ramping). After preconditioning via thermal exposure, the samples were tested to characterize their material behavior and microstructure evolutions. The uniaxial bulk specimens were subjected to stress-strain testing to measure their mechanical properties including effective elastic modulus, and Ultimate Tensile Strength (UTS).For the miniature bulk solder samples of each SAC+Bi alloy, the evolutions of the mechanical properties and microstructure for each thermal exposure profile were characterized as a function of the duration of thermal exposure. Several comparisons were then made including: (1) comparing the observed mechanical properties evolutions for the three SAC+Bi alloys to each other, (2) comparing the microstructural evolutions for the three SAC+Bi alloys, and (3) comparing the relative severity of degradations in each alloy occurring for the four different thermal exposure profiles.For all of the alloys, the degradations for the slow thermal cycling exposure were the largest, while those for isothermal aging were surprisingly the smallest. Increasing the Bi content of the SAC+Bi alloy led to increased mitigation of thermal degradation effects for all of the exposure profiles. Reduced microstructural evolution in the SAC+Bi alloy samples was found to be the major reason for the improved resistance to mechanical behavior changes. The tensile strength results for samples with 2% Bi and 3% were nearly the same, suggesting that lower bismuth content could be sufficient for many applications." @default.
- W4285103285 created "2022-07-14" @default.
- W4285103285 creator A5032623445 @default.
- W4285103285 creator A5036335857 @default.
- W4285103285 creator A5049487571 @default.
- W4285103285 creator A5068741078 @default.
- W4285103285 creator A5073185500 @default.
- W4285103285 date "2022-05-01" @default.
- W4285103285 modified "2023-10-18" @default.
- W4285103285 title "Mechanical Property Evolution in SAC+Bi Lead-Free Solders Subjected to Various Thermal Exposure Profiles" @default.
- W4285103285 cites W1621319484 @default.
- W4285103285 cites W1975707380 @default.
- W4285103285 cites W1981299422 @default.
- W4285103285 cites W2002362498 @default.
- W4285103285 cites W2016005563 @default.
- W4285103285 cites W2018938304 @default.
- W4285103285 cites W2040180369 @default.
- W4285103285 cites W2043961621 @default.
- W4285103285 cites W2064782593 @default.
- W4285103285 cites W2076838552 @default.
- W4285103285 cites W2090903401 @default.
- W4285103285 cites W2093629377 @default.
- W4285103285 cites W2146160076 @default.
- W4285103285 cites W3085650845 @default.
- W4285103285 cites W3187874033 @default.
- W4285103285 cites W3191141382 @default.
- W4285103285 doi "https://doi.org/10.1109/ectc51906.2022.00260" @default.
- W4285103285 hasPublicationYear "2022" @default.
- W4285103285 type Work @default.
- W4285103285 citedByCount "6" @default.
- W4285103285 countsByYear W42851032852022 @default.
- W4285103285 countsByYear W42851032852023 @default.
- W4285103285 crossrefType "proceedings-article" @default.
- W4285103285 hasAuthorship W4285103285A5032623445 @default.
- W4285103285 hasAuthorship W4285103285A5036335857 @default.
- W4285103285 hasAuthorship W4285103285A5049487571 @default.
- W4285103285 hasAuthorship W4285103285A5068741078 @default.
- W4285103285 hasAuthorship W4285103285A5073185500 @default.
- W4285103285 hasConcept C121332964 @default.
- W4285103285 hasConcept C133347239 @default.
- W4285103285 hasConcept C151637689 @default.
- W4285103285 hasConcept C159985019 @default.
- W4285103285 hasConcept C176177977 @default.
- W4285103285 hasConcept C177564732 @default.
- W4285103285 hasConcept C192562407 @default.
- W4285103285 hasConcept C204530211 @default.
- W4285103285 hasConcept C50296614 @default.
- W4285103285 hasConcept C70410870 @default.
- W4285103285 hasConcept C71924100 @default.
- W4285103285 hasConcept C94709252 @default.
- W4285103285 hasConcept C97355855 @default.
- W4285103285 hasConceptScore W4285103285C121332964 @default.
- W4285103285 hasConceptScore W4285103285C133347239 @default.
- W4285103285 hasConceptScore W4285103285C151637689 @default.
- W4285103285 hasConceptScore W4285103285C159985019 @default.
- W4285103285 hasConceptScore W4285103285C176177977 @default.
- W4285103285 hasConceptScore W4285103285C177564732 @default.
- W4285103285 hasConceptScore W4285103285C192562407 @default.
- W4285103285 hasConceptScore W4285103285C204530211 @default.
- W4285103285 hasConceptScore W4285103285C50296614 @default.
- W4285103285 hasConceptScore W4285103285C70410870 @default.
- W4285103285 hasConceptScore W4285103285C71924100 @default.
- W4285103285 hasConceptScore W4285103285C94709252 @default.
- W4285103285 hasConceptScore W4285103285C97355855 @default.
- W4285103285 hasLocation W42851032851 @default.
- W4285103285 hasOpenAccess W4285103285 @default.
- W4285103285 hasPrimaryLocation W42851032851 @default.
- W4285103285 hasRelatedWork W2070495597 @default.
- W4285103285 hasRelatedWork W2083205683 @default.
- W4285103285 hasRelatedWork W2086984805 @default.
- W4285103285 hasRelatedWork W2091075133 @default.
- W4285103285 hasRelatedWork W2116238844 @default.
- W4285103285 hasRelatedWork W2187773344 @default.
- W4285103285 hasRelatedWork W2262375835 @default.
- W4285103285 hasRelatedWork W2394148533 @default.
- W4285103285 hasRelatedWork W2562822399 @default.
- W4285103285 hasRelatedWork W3011062973 @default.
- W4285103285 isParatext "false" @default.
- W4285103285 isRetracted "false" @default.
- W4285103285 workType "article" @default.