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• W4285280388 abstract "We report one sort of weak physical unclonable functions (PUFs) composed of 14-nm nFinFETs with entropy of the random-trap-fluctuation (RTF). After the positive-bias-temperature-instability (PBTI) stress at high temperatures (85 °C ~ 150 °C), the generation of abundant random traps at the interface of gate-dielectric layers and channel efficiently improves cryptographic parameters of nFinFET-PUFs. Results show that bit-error-rates of the MOSAIC plots reduce to 1.4%; average values/standard-deviation of the inter- and intra- Hamming-distance reach 50.28%/1.7% and 0.38%/0.42%, respectively. This work provides an implacable technique to boost characteristics of weak PUFs through combinations of device-reliability and cryptography." @default.
• W4285280388 created "2022-07-14" @default.
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• W4285280388 date "2022-09-01" @default.
• W4285280388 modified "2023-10-17" @default.
• W4285280388 title "Positive-Bias-Temperature-Instability Induced Random-Trap-Fluctuation Enhanced Physical Unclonable Functions on 14-nm nFinFETs" @default.
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• W4285280388 doi "https://doi.org/10.1109/led.2022.3188492" @default.
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