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• W4289338959 abstract "Field-emission resonances (FERs) for two-dimensional Pb(111) islands grown on Si(111)7×7 surfaces were studied by low-temperature scanning tunneling microscopy and spectroscopy (STM/STS) in a broad range of tunneling conditions with both an active and disabled feedback loop. These FERs exist at quantized sample-to-tip distances Zn above the sample surface, where n is the serial number of the FER state. By recording the trajectory of the STM tip during ramping of the bias voltage U (while keeping the tunneling current I fixed), we obtain the set of the Zn values corresponding to local maxima in the derived dZ/dU(U) spectra. This way, the continuous evolution of Zn as a function of U for all FERs was investigated by STS experiments with an active feedback loop for different I. Complementing these measurements by current–distance spectroscopy at a fixed U, we could construct a 4-dimensional I–U–Z–dZ/dU diagram that allows us to investigate the geometric localization of the FERs above the surface. We demonstrate (i) that the difference δZn = Zn+1 – Zn between neighboring FER lines in the Z–U diagram is independent of n for higher resonances; (ii) that the δZn value decreases as U increases; (iii) that the quantized FER states lead to the periodic variations of ln I as a function of Z with periodicity δZ; and (iv) that the periodic variations in the ln I–Z spectra allow an estimation of the absolute height of the tip above the sample surface. Our findings contribute to a deeper understanding on how the FER states affect various types of tunneling spectroscopy experiments and how they lead to a nonexponential decay of the tunneling current as a function of Z at high bias voltages in the regime of quantized electron emission." @default.
• W4289338959 created "2022-08-02" @default.
• W4289338959 creator A5039211990 @default.
• W4289338959 creator A5061221078 @default.
• W4289338959 date "2022-08-01" @default.
• W4289338959 modified "2023-09-23" @default.
• W4289338959 title "Field-Emission Resonances in Thin Metallic Films: Nonexponential Decrease of the Tunneling Current as a Function of the Sample-to-Tip Distance" @default.
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• W4289338959 doi "https://doi.org/10.1021/acs.jpcc.2c02374" @default.
• W4289338959 hasPublicationYear "2022" @default.
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