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- W4289886472 abstract "Abstract Weak open contacts are common in DRAM cell arrays where they act as a resistance between the cell capacitor and wordline transistor. This article discusses the role of weak open contacts in DRAM failures, the factors that influence their effect on read and write operations, and the complexities involved in assessing potential problems." @default.
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- W4289886472 date "2005-05-01" @default.
- W4289886472 modified "2023-10-04" @default.
- W4289886472 title "Single-Cell Failures Caused by a Lateral Gate Effect" @default.
- W4289886472 doi "https://doi.org/10.31399/asm.edfa.2005-2.p014" @default.
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