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- W4293491656 abstract "Experimental means to characterize delay faults induced by bit flips and SEUs in I/O blocks of SRAM-based FPGAs are proposed. A delay fault up to 6.2ns sensitized by an events chain is reported." @default.
- W4293491656 created "2022-08-29" @default.
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- W4293491656 date "2014-09-02" @default.
- W4293491656 modified "2023-09-27" @default.
- W4293491656 title "On Delay Faults Affecting I/O Blocks of an SRAM-Based FPGA Due to Ionizing Radiations" @default.
- W4293491656 doi "https://doi.org/10.48550/arxiv.1409.0736" @default.
- W4293491656 hasPublicationYear "2014" @default.
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