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• W4299639710 abstract "Silicon-based CMOS technologies are fast approaching their ultimate limits. By approaching these limits, power dissipation, fabrication yield, and reliability worsen steadily making further nanometric scaling increasingly difficult. These problems would stop further scaling of silicon-based CMOS technologies at channel lengths between 10 and 20 nm. But even before reaching these limits, these problems could become show-stoppers unless new techniques are introduced to maintain acceptable levels of power dissipation, yield and reliability. The paper describes the principles of GRAAL (global reliability architecture approach for logic), a new fault tolerant architecture for logic designs, aimed to provide a global solution for mitigating the above mentioned problems." @default.
• W4299639710 created "2022-10-02" @default.
• W4299639710 creator A5039513293 @default.
• W4299639710 date "2007-01-01" @default.
• W4299639710 modified "2023-10-12" @default.
• W4299639710 title "GRAAL: a new fault tolerant design paradigm for mitigating the flaws of deep nanometric technologies" @default.
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• W4299639710 doi "https://doi.org/10.1109/test.2007.4437666" @default.
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