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• W4299799553 abstract "The growth and the crystalline and electronic structure of Ni deposited on single crystalline Cu(1 1 1) were studied by scanning tunnelling microscopy (STM), grazing incidence X-ray diffraction (GIXD) and angle–resolved photoemission spectroscopy (ARPES). In the early stages of growth monoatomic-high flat Ni islands, partially covered by Cu migrating from the surface, are observed. Starting from a pseudomorphic epitaxial relationship the in-plane lattice parameter progressively relaxes with increasing coverage. For a 20 monolayer (ML) thick deposit the in-plane lattice parameter is still found halfway between the bulk Ni and Cu lattice parameters. ARPES data also rule out the layer-by-layer growth and provide the values of the Ni exchange splitting." @default.
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• W4299799553 date "2006-09-01" @default.
• W4299799553 modified "2023-09-30" @default.
• W4299799553 title "Structural and electronic properties of thin Ni layers on Cu(111) as investigated by ARPES, STM and GIXD" @default.
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• W4299799553 doi "https://doi.org/10.1016/j.susc.2006.01.104" @default.
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