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- W4302340104 abstract "The gap between cell and module efficiency is a major challenge for all photovoltaic (PV) technologies. For monolithic thin film PV modules, a significant fraction of this gap has been attributed to parasitic shunts, and other defects, distributed across the module. In this paper, we show that it is possible to contain or isolate these shunt defects, using the state of the art laser scribing processes, after the fabrication of the series connected module is finished. We discuss three possible alternatives, and quantify the performance gains for each technique. We demonstrate that using these techniques, it is possible to recover up to 50% of the power lost to parasitic shunts, which results in 1-2% (absolute) increase in module efficiencies for typical thin film PV technologies." @default.
- W4302340104 created "2022-10-06" @default.
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- W4302340104 date "2013-07-04" @default.
- W4302340104 modified "2023-09-24" @default.
- W4302340104 title "In-Line Post-Process Scribing for Reducing Cell to Module Efficiency Gap in Monolithic Thin Film Photovoltaics" @default.
- W4302340104 doi "https://doi.org/10.48550/arxiv.1307.1698" @default.
- W4302340104 hasPublicationYear "2013" @default.
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