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- W4307777360 abstract "We report on the electrical gating of the charge-density-wave phases and current in h-BN-capped three-terminal 1T-TaS2 heterostructure devices. It is demonstrated that the application of a gate bias can shift the source-drain current-voltage hysteresis associated with the transition between the nearly commensurate and incommensurate charge-density-wave phases. The evolution of the hysteresis and the presence of abrupt spikes in the current while sweeping the gate voltage suggest that the effect is electrical rather than self-heating. We attribute the gating to an electric-field effect on the commensurate charge-density-wave domains in the atomic planes near the gate dielectric. The transition between the nearly commensurate and incommensurate charge-density-wave phases can be induced by both the source-drain current and the electrostatic gate. Since the charge-density-wave phases are persistent in 1T-TaS2 at room temperature, one can envision memory applications of such devices when scaled down to the dimensions of individual commensurate domains and few-atomic plane thicknesses." @default.
- W4307777360 created "2022-11-05" @default.
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- W4307777360 date "2022-10-31" @default.
- W4307777360 modified "2023-10-10" @default.
- W4307777360 title "Electrical Gating of the Charge-Density-Wave Phases in Two-Dimensional <i>h</i>-BN/1T-TaS<sub>2</sub> Devices" @default.
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- W4307777360 doi "https://doi.org/10.1021/acsnano.2c07876" @default.
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