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- W4308906594 abstract "AbstractWith the continuous shrinking of MOSFET reaching its extreme limit, the performance of the MOSFET has taken a hit due to the various short channel effects like leakage current in devices. CNTFET looks like a promising nanoelectronic device to replace the existing MOSFET as it offers better performance due to the higher quality of electrical and mechanical properties of CNT. In this study, the effect of process parameters on carbon nanotube diameter, produced via the PECVD technique, has been studied. Furthermore, the impact of carbon nanotube (CNT) diameter on the current–voltage characteristics of CNTFET has been observed. We have observed and concluded the effects of variation in the diameter of the carbon nanotube on device metrics such as mobility (µ) and carrier density (n).KeywordsCNTFETCarbon nanotubesPECVD" @default.
- W4308906594 created "2022-11-19" @default.
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- W4308906594 date "2022-11-11" @default.
- W4308906594 modified "2023-10-16" @default.
- W4308906594 title "Effect of Process Parameters on CNTFET" @default.
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- W4308906594 doi "https://doi.org/10.1007/978-981-16-9523-0_44" @default.
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