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- W4310255056 abstract "In this study, we investigated the piezoelectric characteristics of the sol-gel Pb(Zr0.52Ti0.48)O3 (PZT) films deposited on two different types of substrates. Epitaxial PZT piezoelectric thin films were grown on ZrO2-buffered Si substrates, while polycrystalline PZT thin films were grown on conventional Pt/Ti/Si substrates by the sol–gel method. X-ray diffraction measurements revealed a cube-on-cube epitaxy on the buffered Si substrate. The piezoelectric coefficient (e31,f) of the epitaxial PZT thin films was investigated by measuring the tip displacement of PZT cantilevers, and the |e31,f | values were in the range of 8.9–12 C/m2. The voltage dependence of the |e31,f | values was more constant than that of the polycrystalline sol–gel PZT/Si cantilever. The epitaxial sol–gel PZT films thus exhibited good piezoelectric properties for applications in microelectromechanical systems devices." @default.
- W4310255056 created "2022-11-30" @default.
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- W4310255056 date "2023-01-01" @default.
- W4310255056 modified "2023-10-18" @default.
- W4310255056 title "Piezoelectric properties of epitaxial Pb(Zr,Ti)O3 thin films grown on Si substrates by the sol–gel method" @default.
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- W4310255056 doi "https://doi.org/10.1016/j.tsf.2022.139612" @default.
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