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• W4312036189 abstract "Test sets that target several fault models are important for addressing the need to achieve comprehensive defect coverage. A commonly used test generation process tops off the test set to address the fault models one by one. However, if the test set becomes excessively large, the order by which the fault models are targeted creates a bias in their fault coverages. This article considers the scenario where (1) a bound on the number of tests is introduced in advance, and (2) after targeting a fault model <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{0}$</tex> , the detection of faults from fault models <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{1}$</tex> and <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{2}$</tex> is equally important for improving the quality of the test set. The article introduces a test generation objective that balances the detection of faults from <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{1}$</tex> and <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{2}$</tex> to reduce the bias toward one of them. It then describes a test generation procedure that uses the objective to produce a balanced test set in the case where a compressed test set for <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{0}$</tex> (consisting of single stuck-at faults) is used for producing all the tests for <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{1}$</tex> and <tex xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>$F_{2}$</tex> (consisting of single-cycle gate-exhaustive faults and bridging faults, respectively). Experimental results for benchmark circuits are presented to support the discussion." @default.
• W4312036189 created "2023-01-04" @default.
• W4312036189 creator A5032651920 @default.
• W4312036189 date "2022-11-01" @default.
• W4312036189 modified "2023-09-26" @default.
• W4312036189 title "Two-Dimensional Test Generation Objective" @default.
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• W4312036189 doi "https://doi.org/10.1109/ats56056.2022.00031" @default.
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