FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4312051070> ?p ?o ?g. }

• W4312051070 endingPage "6551" @default.
• W4312051070 startingPage "6547" @default.
• W4312051070 abstract "This work investigates trap generation in gate stacks of ferroelectric field-effect transistor (FeFET) with TiN/Hf0.5Zr0.5O2/SiOx/Si gate structure during endurance fatigue by using the low-frequency noise method. We find that the traps are generated not only at Hf0.5Zr0.5O2/SiOx interface but also in both the Hf0.5Zr0.5O2 and SiOx. Our work provides evidence of defect generation inside the ferroelectric layer of FeFET during cycling. Furthermore, the traps in the SiOx are more detrimental to endurance fatigue. And the trap generation in the SiOx is more important than its initial trap density for endurance fatigue. Our work is helpful in deeply understanding the endurance of FeFET." @default.
• W4312051070 created "2023-01-04" @default.
• W4312051070 creator A5002180699 @default.
• W4312051070 creator A5033965475 @default.
• W4312051070 creator A5037691180 @default.
• W4312051070 creator A5040023626 @default.
• W4312051070 creator A5041615081 @default.
• W4312051070 creator A5049188751 @default.
• W4312051070 creator A5049556721 @default.
• W4312051070 creator A5061396145 @default.
• W4312051070 creator A5068759400 @default.
• W4312051070 creator A5072969569 @default.
• W4312051070 date "2022-12-01" @default.
• W4312051070 modified "2023-10-13" @default.
• W4312051070 title "Trap Generation in Whole Gate Stacks of FeFET With TiN/Hf_0.5Zr_0.5O₂/SiO_x/Si (MFIS) Gate Structure During Endurance Fatigue" @default.
• W4312051070 cites W1625170149 @default.
• W4312051070 cites W1976902828 @default.
• W4312051070 cites W1987850127 @default.
• W4312051070 cites W2006983911 @default.
• W4312051070 cites W2036663977 @default.
• W4312051070 cites W2043869719 @default.
• W4312051070 cites W2097061230 @default.
• W4312051070 cites W2099779865 @default.
• W4312051070 cites W2104927688 @default.
• W4312051070 cites W2482978312 @default.
• W4312051070 cites W2563420461 @default.
• W4312051070 cites W2583357209 @default.
• W4312051070 cites W2769364246 @default.
• W4312051070 cites W2800070060 @default.
• W4312051070 cites W2906127697 @default.
• W4312051070 cites W2914508189 @default.
• W4312051070 cites W2918861294 @default.
• W4312051070 cites W2944441606 @default.
• W4312051070 cites W3009598260 @default.
• W4312051070 cites W3023396632 @default.
• W4312051070 cites W3038236592 @default.
• W4312051070 cites W3045396652 @default.
• W4312051070 cites W3080194167 @default.
• W4312051070 cites W3108681192 @default.
• W4312051070 cites W3164014422 @default.
• W4312051070 cites W3214421929 @default.
• W4312051070 cites W4226077336 @default.
• W4312051070 cites W4286571745 @default.
• W4312051070 doi "https://doi.org/10.1109/ted.2022.3215935" @default.
• W4312051070 hasPublicationYear "2022" @default.
• W4312051070 type Work @default.
• W4312051070 citedByCount "2" @default.
• W4312051070 countsByYear W43120510702023 @default.
• W4312051070 crossrefType "journal-article" @default.
• W4312051070 hasAuthorship W4312051070A5002180699 @default.
• W4312051070 hasAuthorship W4312051070A5033965475 @default.
• W4312051070 hasAuthorship W4312051070A5037691180 @default.
• W4312051070 hasAuthorship W4312051070A5040023626 @default.
• W4312051070 hasAuthorship W4312051070A5041615081 @default.
• W4312051070 hasAuthorship W4312051070A5049188751 @default.
• W4312051070 hasAuthorship W4312051070A5049556721 @default.
• W4312051070 hasAuthorship W4312051070A5061396145 @default.
• W4312051070 hasAuthorship W4312051070A5068759400 @default.
• W4312051070 hasAuthorship W4312051070A5072969569 @default.
• W4312051070 hasConcept C119599485 @default.
• W4312051070 hasConcept C121099081 @default.
• W4312051070 hasConcept C127413603 @default.
• W4312051070 hasConcept C133386390 @default.
• W4312051070 hasConcept C145598152 @default.
• W4312051070 hasConcept C165801399 @default.
• W4312051070 hasConcept C172385210 @default.
• W4312051070 hasConcept C191897082 @default.
• W4312051070 hasConcept C192562407 @default.
• W4312051070 hasConcept C24326235 @default.
• W4312051070 hasConcept C49040817 @default.
• W4312051070 hasConcept C525849907 @default.
• W4312051070 hasConcept C544956773 @default.
• W4312051070 hasConcept C79090758 @default.
• W4312051070 hasConcept C87717796 @default.
• W4312051070 hasConceptScore W4312051070C119599485 @default.
• W4312051070 hasConceptScore W4312051070C121099081 @default.
• W4312051070 hasConceptScore W4312051070C127413603 @default.
• W4312051070 hasConceptScore W4312051070C133386390 @default.
• W4312051070 hasConceptScore W4312051070C145598152 @default.
• W4312051070 hasConceptScore W4312051070C165801399 @default.
• W4312051070 hasConceptScore W4312051070C172385210 @default.
• W4312051070 hasConceptScore W4312051070C191897082 @default.
• W4312051070 hasConceptScore W4312051070C192562407 @default.
• W4312051070 hasConceptScore W4312051070C24326235 @default.
• W4312051070 hasConceptScore W4312051070C49040817 @default.
• W4312051070 hasConceptScore W4312051070C525849907 @default.
• W4312051070 hasConceptScore W4312051070C544956773 @default.
• W4312051070 hasConceptScore W4312051070C79090758 @default.
• W4312051070 hasConceptScore W4312051070C87717796 @default.
• W4312051070 hasFunder F4320321001 @default.
• W4312051070 hasIssue "12" @default.
• W4312051070 hasLocation W43120510701 @default.
• W4312051070 hasOpenAccess W4312051070 @default.
• W4312051070 hasPrimaryLocation W43120510701 @default.
• W4312051070 hasRelatedWork W1983659288 @default.
• W4312051070 hasRelatedWork W1988125445 @default.
• W4312051070 hasRelatedWork W2022834994 @default.
• W4312051070 hasRelatedWork W2039595689 @default.

• next