FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4313229740> ?p ?o ?g. }

• W4313229740 endingPage "228" @default.
• W4313229740 startingPage "225" @default.
• W4313229740 abstract "A 600-V p-GaN gate HEMT with buried hole spreading channel (BHSC) is demonstrated to suppress the buffer trap related dynamic <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${R}_{text {ON}}$ </tex-math></inline-formula> degradation. The BHSC is located at the interface between u-GaN and buried AlGaN. In the on-state, the holes injected from the p-GaN gate can effectively spread along the BHSC and screen the negative buffer charges. The hole spreading effect is verified by a detection of hole current from the sidewall of BHSC. The screening effect is verified by a positive substrate stress test that intentionally induces severe buffer trapping, which is widely known to cause severe dynamic <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${R}_{text {ON}}$ </tex-math></inline-formula> degradation in traditional GaN HEMTs. However, the propose device exhibits an immunity against buffer trapping owing to the screening effect of the holes along BHSC. The dynamic performance with as short as <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>$sim 20~mu text{s}$ </tex-math></inline-formula> delay after a 400-V substrate stress is characterized. Nearly zero buffer trap related dynamic <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${R}_{text {ON}}$ </tex-math></inline-formula> degradation is achieved." @default.
• W4313229740 created "2023-01-06" @default.
• W4313229740 creator A5019475903 @default.
• W4313229740 creator A5020072949 @default.
• W4313229740 creator A5038895726 @default.
• W4313229740 creator A5040628972 @default.
• W4313229740 creator A5048038580 @default.
• W4313229740 creator A5059850766 @default.
• W4313229740 creator A5070108037 @default.
• W4313229740 creator A5083179012 @default.
• W4313229740 date "2023-02-01" @default.
• W4313229740 modified "2023-10-16" @default.
• W4313229740 title "600-V p-GaN Gate HEMT With Buried Hole Spreading Channel Demonstrating Immunity Against Buffer Trapping Effects" @default.
• W4313229740 cites W1801635354 @default.
• W4313229740 cites W1886480411 @default.
• W4313229740 cites W1982645148 @default.
• W4313229740 cites W2059874934 @default.
• W4313229740 cites W2074853235 @default.
• W4313229740 cites W2112559006 @default.
• W4313229740 cites W2117631269 @default.
• W4313229740 cites W2123617889 @default.
• W4313229740 cites W2129203753 @default.
• W4313229740 cites W2135780270 @default.
• W4313229740 cites W2137778525 @default.
• W4313229740 cites W2245481706 @default.
• W4313229740 cites W2280751649 @default.
• W4313229740 cites W2292033362 @default.
• W4313229740 cites W2325968874 @default.
• W4313229740 cites W2593495332 @default.
• W4313229740 cites W2623811665 @default.
• W4313229740 cites W2765963602 @default.
• W4313229740 cites W2774349069 @default.
• W4313229740 cites W2786265152 @default.
• W4313229740 cites W2788013722 @default.
• W4313229740 cites W2803423907 @default.
• W4313229740 cites W2806602868 @default.
• W4313229740 cites W2959606876 @default.
• W4313229740 cites W2967945770 @default.
• W4313229740 cites W2984691535 @default.
• W4313229740 cites W3040292463 @default.
• W4313229740 cites W3159881882 @default.
• W4313229740 cites W3186955288 @default.
• W4313229740 cites W4226022786 @default.
• W4313229740 cites W4285109938 @default.
• W4313229740 doi "https://doi.org/10.1109/led.2022.3232474" @default.
• W4313229740 hasPublicationYear "2023" @default.
• W4313229740 type Work @default.
• W4313229740 citedByCount "3" @default.
• W4313229740 countsByYear W43132297402023 @default.
• W4313229740 crossrefType "journal-article" @default.
• W4313229740 hasAuthorship W4313229740A5019475903 @default.
• W4313229740 hasAuthorship W4313229740A5020072949 @default.
• W4313229740 hasAuthorship W4313229740A5038895726 @default.
• W4313229740 hasAuthorship W4313229740A5040628972 @default.
• W4313229740 hasAuthorship W4313229740A5048038580 @default.
• W4313229740 hasAuthorship W4313229740A5059850766 @default.
• W4313229740 hasAuthorship W4313229740A5070108037 @default.
• W4313229740 hasAuthorship W4313229740A5083179012 @default.
• W4313229740 hasConcept C11413529 @default.
• W4313229740 hasConcept C114614502 @default.
• W4313229740 hasConcept C121099081 @default.
• W4313229740 hasConcept C121332964 @default.
• W4313229740 hasConcept C153294291 @default.
• W4313229740 hasConcept C162057924 @default.
• W4313229740 hasConcept C165801399 @default.
• W4313229740 hasConcept C172385210 @default.
• W4313229740 hasConcept C184720557 @default.
• W4313229740 hasConcept C18903297 @default.
• W4313229740 hasConcept C192562407 @default.
• W4313229740 hasConcept C2777289219 @default.
• W4313229740 hasConcept C2777924906 @default.
• W4313229740 hasConcept C33923547 @default.
• W4313229740 hasConcept C41008148 @default.
• W4313229740 hasConcept C45357846 @default.
• W4313229740 hasConcept C49040817 @default.
• W4313229740 hasConcept C62520636 @default.
• W4313229740 hasConcept C86803240 @default.
• W4313229740 hasConcept C94375191 @default.
• W4313229740 hasConceptScore W4313229740C11413529 @default.
• W4313229740 hasConceptScore W4313229740C114614502 @default.
• W4313229740 hasConceptScore W4313229740C121099081 @default.
• W4313229740 hasConceptScore W4313229740C121332964 @default.
• W4313229740 hasConceptScore W4313229740C153294291 @default.
• W4313229740 hasConceptScore W4313229740C162057924 @default.
• W4313229740 hasConceptScore W4313229740C165801399 @default.
• W4313229740 hasConceptScore W4313229740C172385210 @default.
• W4313229740 hasConceptScore W4313229740C184720557 @default.
• W4313229740 hasConceptScore W4313229740C18903297 @default.
• W4313229740 hasConceptScore W4313229740C192562407 @default.
• W4313229740 hasConceptScore W4313229740C2777289219 @default.
• W4313229740 hasConceptScore W4313229740C2777924906 @default.
• W4313229740 hasConceptScore W4313229740C33923547 @default.
• W4313229740 hasConceptScore W4313229740C41008148 @default.
• W4313229740 hasConceptScore W4313229740C45357846 @default.
• W4313229740 hasConceptScore W4313229740C49040817 @default.
• W4313229740 hasConceptScore W4313229740C62520636 @default.
• W4313229740 hasConceptScore W4313229740C86803240 @default.
• W4313229740 hasConceptScore W4313229740C94375191 @default.

• next