FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W4313362273> ?p ?o ?g. }

• W4313362273 endingPage "158" @default.
• W4313362273 startingPage "158" @default.
• W4313362273 abstract "Condition monitoring (CM) of industrial processes is essential for reducing downtime and increasing productivity through accurate Condition-Based Maintenance (CBM) scheduling. Indeed, advanced intelligent learning systems for Fault Diagnosis (FD) make it possible to effectively isolate and identify the origins of faults. Proven smart industrial infrastructure technology enables FD to be a fully decentralized distributed computing task. To this end, such distribution among different regions/institutions, often subject to so-called data islanding, is limited to privacy, security risks, and industry competition due to the limitation of legal regulations or conflicts of interest. Therefore, Federated Learning (FL) is considered an efficient process of separating data from multiple participants to collaboratively train an intelligent and reliable FD model. As no comprehensive study has been introduced on this subject to date, as far as we know, such a review-based study is urgently needed. Within this scope, our work is devoted to reviewing recent advances in FL applications for process diagnostics, while FD methods, challenges, and future prospects are given special attention." @default.
• W4313362273 created "2023-01-06" @default.
• W4313362273 creator A5001689290 @default.
• W4313362273 creator A5017088097 @default.
• W4313362273 creator A5035730211 @default.
• W4313362273 creator A5040353704 @default.
• W4313362273 creator A5074477100 @default.
• W4313362273 date "2022-12-29" @default.
• W4313362273 modified "2023-09-30" @default.
• W4313362273 title "Federated Learning for Condition Monitoring of Industrial Processes: A Review on Fault Diagnosis Methods, Challenges, and Prospects" @default.
• W4313362273 cites W2513938116 @default.
• W4313362273 cites W2741636173 @default.
• W4313362273 cites W2765317657 @default.
• W4313362273 cites W2995191368 @default.
• W4313362273 cites W3013310637 @default.
• W4313362273 cites W3046653923 @default.
• W4313362273 cites W3086809868 @default.
• W4313362273 cites W3091870957 @default.
• W4313362273 cites W3115710758 @default.
• W4313362273 cites W3123459983 @default.
• W4313362273 cites W3134843574 @default.
• W4313362273 cites W3135855722 @default.
• W4313362273 cites W3138513656 @default.
• W4313362273 cites W3139011613 @default.
• W4313362273 cites W3159080474 @default.
• W4313362273 cites W3171802458 @default.
• W4313362273 cites W3175168574 @default.
• W4313362273 cites W3180515657 @default.
• W4313362273 cites W3180608480 @default.
• W4313362273 cites W3194611247 @default.
• W4313362273 cites W3196371845 @default.
• W4313362273 cites W3196965143 @default.
• W4313362273 cites W3197272920 @default.
• W4313362273 cites W3200969281 @default.
• W4313362273 cites W3202645507 @default.
• W4313362273 cites W3206162503 @default.
• W4313362273 cites W3208334254 @default.
• W4313362273 cites W3209598599 @default.
• W4313362273 cites W3215694762 @default.
• W4313362273 cites W4200491078 @default.
• W4313362273 cites W4205708288 @default.
• W4313362273 cites W4206707323 @default.
• W4313362273 cites W4211051107 @default.
• W4313362273 cites W4213010368 @default.
• W4313362273 cites W4213436114 @default.
• W4313362273 cites W4220842548 @default.
• W4313362273 cites W4226051439 @default.
• W4313362273 cites W4229029907 @default.
• W4313362273 cites W4283311573 @default.
• W4313362273 cites W4283747666 @default.
• W4313362273 cites W4285079201 @default.
• W4313362273 cites W4285200947 @default.
• W4313362273 cites W4286214165 @default.
• W4313362273 cites W4286543467 @default.
• W4313362273 cites W4293155325 @default.
• W4313362273 cites W4297478325 @default.
• W4313362273 doi "https://doi.org/10.3390/electronics12010158" @default.
• W4313362273 hasPublicationYear "2022" @default.
• W4313362273 type Work @default.
• W4313362273 citedByCount "2" @default.
• W4313362273 countsByYear W43133622732023 @default.
• W4313362273 crossrefType "journal-article" @default.
• W4313362273 hasAuthorship W4313362273A5001689290 @default.
• W4313362273 hasAuthorship W4313362273A5017088097 @default.
• W4313362273 hasAuthorship W4313362273A5035730211 @default.
• W4313362273 hasAuthorship W4313362273A5040353704 @default.
• W4313362273 hasAuthorship W4313362273A5074477100 @default.
• W4313362273 hasBestOaLocation W43133622731 @default.
• W4313362273 hasConcept C111919701 @default.
• W4313362273 hasConcept C112930515 @default.
• W4313362273 hasConcept C127313418 @default.
• W4313362273 hasConcept C127413603 @default.
• W4313362273 hasConcept C139719470 @default.
• W4313362273 hasConcept C144133560 @default.
• W4313362273 hasConcept C162324750 @default.
• W4313362273 hasConcept C165205528 @default.
• W4313362273 hasConcept C175551986 @default.
• W4313362273 hasConcept C180591934 @default.
• W4313362273 hasConcept C199360897 @default.
• W4313362273 hasConcept C201995342 @default.
• W4313362273 hasConcept C204983608 @default.
• W4313362273 hasConcept C206729178 @default.
• W4313362273 hasConcept C21547014 @default.
• W4313362273 hasConcept C2778012447 @default.
• W4313362273 hasConcept C2780451532 @default.
• W4313362273 hasConcept C38652104 @default.
• W4313362273 hasConcept C41008148 @default.
• W4313362273 hasConcept C98045186 @default.
• W4313362273 hasConceptScore W4313362273C111919701 @default.
• W4313362273 hasConceptScore W4313362273C112930515 @default.
• W4313362273 hasConceptScore W4313362273C127313418 @default.
• W4313362273 hasConceptScore W4313362273C127413603 @default.
• W4313362273 hasConceptScore W4313362273C139719470 @default.
• W4313362273 hasConceptScore W4313362273C144133560 @default.
• W4313362273 hasConceptScore W4313362273C162324750 @default.
• W4313362273 hasConceptScore W4313362273C165205528 @default.
• W4313362273 hasConceptScore W4313362273C175551986 @default.
• W4313362273 hasConceptScore W4313362273C180591934 @default.

• next