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• W4313598834 endingPage "2141" @default.
• W4313598834 startingPage "2135" @default.
• W4313598834 abstract "Characterization, modeling, and development of cryo-temperature CMOS technologies (cryo-CMOS) have significantly progressed to help overcome the interconnection bottleneck between qubits and the readout interface in quantum computers. Nevertheless, available compact models still fail to predict the deviation of 1/f noise from the expected linear scaling with temperature ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${T}$ </tex-math></inline-formula> ), referred to as “excess 1/f noise,” observed at cryogenic temperatures. In addition, 1/f noise represents one of the main limiting factors for the decoherence time of qubits. In this article, we extensively characterize low-frequency noise on commercial 28-nm CMOS and on research-grade Ge-channel MOSFETs at temperatures ranging from 370 K down to 4 K. Our investigations exclude electron heating and bulk dielectric defects as possible causes of the excess 1/f noise at low temperatures. We show further evidence for a strong correlation between the excess 1/f noise and the saturation of the subthreshold swing (SS) observed at low temperatures. The most plausible cause of the excess noise is found in band tail states in the channel acting as additional capture/emission centers at cryogenic temperatures." @default.
• W4313598834 created "2023-01-06" @default.
• W4313598834 creator A5007746953 @default.
• W4313598834 creator A5008355061 @default.
• W4313598834 creator A5033037232 @default.
• W4313598834 creator A5051359840 @default.
• W4313598834 creator A5058263075 @default.
• W4313598834 creator A5068577719 @default.
• W4313598834 creator A5076478334 @default.
• W4313598834 date "2023-04-01" @default.
• W4313598834 modified "2023-10-14" @default.
• W4313598834 title "Understanding the Excess 1/f Noise in MOSFETs at Cryogenic Temperatures" @default.
• W4313598834 cites W1513904472 @default.
• W4313598834 cites W1973411962 @default.
• W4313598834 cites W2016565894 @default.
• W4313598834 cites W2056905904 @default.
• W4313598834 cites W2087773447 @default.
• W4313598834 cites W2096652287 @default.
• W4313598834 cites W2097061230 @default.
• W4313598834 cites W2289042536 @default.
• W4313598834 cites W2524462216 @default.
• W4313598834 cites W2585884280 @default.
• W4313598834 cites W2594082276 @default.
• W4313598834 cites W2745278755 @default.
• W4313598834 cites W2802502993 @default.
• W4313598834 cites W2806224692 @default.
• W4313598834 cites W2996946661 @default.
• W4313598834 cites W3037853801 @default.
• W4313598834 cites W3088864842 @default.
• W4313598834 cites W3100798923 @default.
• W4313598834 cites W3109157858 @default.
• W4313598834 cites W3194971064 @default.
• W4313598834 cites W3203060215 @default.
• W4313598834 cites W4212867390 @default.
• W4313598834 cites W4224124454 @default.
• W4313598834 cites W4225540121 @default.
• W4313598834 cites W4317793303 @default.
• W4313598834 doi "https://doi.org/10.1109/ted.2022.3233551" @default.
• W4313598834 hasPublicationYear "2023" @default.
• W4313598834 type Work @default.
• W4313598834 citedByCount "3" @default.
• W4313598834 countsByYear W43135988342023 @default.
• W4313598834 crossrefType "journal-article" @default.
• W4313598834 hasAuthorship W4313598834A5007746953 @default.
• W4313598834 hasAuthorship W4313598834A5008355061 @default.
• W4313598834 hasAuthorship W4313598834A5033037232 @default.
• W4313598834 hasAuthorship W4313598834A5051359840 @default.
• W4313598834 hasAuthorship W4313598834A5058263075 @default.
• W4313598834 hasAuthorship W4313598834A5068577719 @default.
• W4313598834 hasAuthorship W4313598834A5076478334 @default.
• W4313598834 hasBestOaLocation W43135988341 @default.
• W4313598834 hasConcept C112806910 @default.
• W4313598834 hasConcept C113873419 @default.
• W4313598834 hasConcept C115961682 @default.
• W4313598834 hasConcept C119599485 @default.
• W4313598834 hasConcept C121332964 @default.
• W4313598834 hasConcept C122527463 @default.
• W4313598834 hasConcept C127413603 @default.
• W4313598834 hasConcept C154945302 @default.
• W4313598834 hasConcept C192562407 @default.
• W4313598834 hasConcept C194257627 @default.
• W4313598834 hasConcept C203087015 @default.
• W4313598834 hasConcept C26873012 @default.
• W4313598834 hasConcept C41008148 @default.
• W4313598834 hasConcept C46362747 @default.
• W4313598834 hasConcept C49040817 @default.
• W4313598834 hasConcept C62520636 @default.
• W4313598834 hasConcept C84114770 @default.
• W4313598834 hasConcept C99498987 @default.
• W4313598834 hasConceptScore W4313598834C112806910 @default.
• W4313598834 hasConceptScore W4313598834C113873419 @default.
• W4313598834 hasConceptScore W4313598834C115961682 @default.
• W4313598834 hasConceptScore W4313598834C119599485 @default.
• W4313598834 hasConceptScore W4313598834C121332964 @default.
• W4313598834 hasConceptScore W4313598834C122527463 @default.
• W4313598834 hasConceptScore W4313598834C127413603 @default.
• W4313598834 hasConceptScore W4313598834C154945302 @default.
• W4313598834 hasConceptScore W4313598834C192562407 @default.
• W4313598834 hasConceptScore W4313598834C194257627 @default.
• W4313598834 hasConceptScore W4313598834C203087015 @default.
• W4313598834 hasConceptScore W4313598834C26873012 @default.
• W4313598834 hasConceptScore W4313598834C41008148 @default.
• W4313598834 hasConceptScore W4313598834C46362747 @default.
• W4313598834 hasConceptScore W4313598834C49040817 @default.
• W4313598834 hasConceptScore W4313598834C62520636 @default.
• W4313598834 hasConceptScore W4313598834C84114770 @default.
• W4313598834 hasConceptScore W4313598834C99498987 @default.
• W4313598834 hasIssue "4" @default.
• W4313598834 hasLocation W43135988341 @default.
• W4313598834 hasLocation W43135988342 @default.
• W4313598834 hasOpenAccess W4313598834 @default.
• W4313598834 hasPrimaryLocation W43135988341 @default.
• W4313598834 hasRelatedWork W1846764600 @default.
• W4313598834 hasRelatedWork W1995988599 @default.
• W4313598834 hasRelatedWork W2002045841 @default.
• W4313598834 hasRelatedWork W2005812233 @default.
• W4313598834 hasRelatedWork W2016195929 @default.
• W4313598834 hasRelatedWork W2044264724 @default.

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