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- W4320930448 abstract "Since the performance of every optical component is directly influenced by the existence of aberration, the measurement of wave aberration is essential in characterizing such components. Interferometry is one of the effective methods to obtain a clear information on the performance of such lenses." @default.
- W4320930448 created "2023-02-16" @default.
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- W4320930448 date "1987-01-01" @default.
- W4320930448 modified "2023-09-24" @default.
- W4320930448 title "Comparison of Two Interferometric Methods for Wave Aberration Measurement in Distributed-Index Microlens" @default.
- W4320930448 cites W1978275399 @default.
- W4320930448 cites W1987850037 @default.
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- W4320930448 doi "https://doi.org/10.1364/giois.1987.fa5" @default.
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