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- W4323664699 endingPage "2559" @default.
- W4323664699 startingPage "2559" @default.
- W4323664699 abstract "Monitoring the temperature of a semiconductor component allows for the prediction of potential failures, optimization of the selected cooling system, and extension of the useful life of the semiconductor component. There are many methods of measuring the crystal temperature of the semiconductor element referred to as a die. The resolution and accuracy of the measurements depend on the chosen method. This paper describes known methods for measuring and imaging the temperature distribution on the die surface of a semiconductor device. Relationships are also described that allow one to determine the die temperature on the basis of the case temperature. Current trends and directions of development for die temperature measurement methods are indicated." @default.
- W4323664699 created "2023-03-10" @default.
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- W4323664699 creator A5030889114 @default.
- W4323664699 creator A5034949633 @default.
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- W4323664699 date "2023-03-08" @default.
- W4323664699 modified "2023-09-27" @default.
- W4323664699 title "Methods of Measurement of Die Temperature of Semiconductor Elements: A Review" @default.
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- W4323664699 doi "https://doi.org/10.3390/en16062559" @default.
- W4323664699 hasPublicationYear "2023" @default.
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