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Matches in SemOpenAlex for { <https://semopenalex.org/work/W4360585747> ?p ?o ?g. }

• W4360585747 abstract "Aging phenomena are first evidenced at device level to cell level considering a precise knowledge of the leading degradation mechanisms and interactions useful for processing optimization focusing performance vs. reliability requirements. Digital to analog circuits are then studied for product qualification based on the former results that needs specific methodologies adapted case by case with mission profile and the correlation between sensing parameter, accelerating factors for lifetime margin. This represents huge challenges for operational lifetime determination, considering top down and bottom up consistencies for relevant product qualification." @default.
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• W4360585747 date "2022-10-09" @default.
• W4360585747 modified "2023-10-14" @default.
• W4360585747 title "Device Reliability to Circuit Qualification: Insights and Challenges" @default.
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• W4360585747 doi "https://doi.org/10.1109/iirw56459.2022.10077885" @default.
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