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- W4376606618 abstract "This work demonstrates an SCR-Diode series ESD Protection concept, which can be engineered to provide a custom TLP I-V characteristic. SCRs and diodes with dimensional variations have been used in different combinations and width ratios, which results in a range of TLP I-V characteristics. This protection circuit comes with several advantages as adaptability for various ESD protection windows, the benefits of using SCR as a protection device and the ease of designing the circuit. Along with TCAD studies, experimental data demonstrates that N-well and P-well doping of SCR can be used to further tune the Vhold and Ron of the protection circuit." @default.
- W4376606618 created "2023-05-17" @default.
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- W4376606618 date "2023-03-01" @default.
- W4376606618 modified "2023-09-27" @default.
- W4376606618 title "Engineering Custom TLP I-V Characteristic Using a SCR-Diode Series ESD Protection Concept" @default.
- W4376606618 doi "https://doi.org/10.1109/irps48203.2023.10118220" @default.
- W4376606618 hasPublicationYear "2023" @default.
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