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- W4377003539 abstract "Transmission electron microscopy uses an electron beam to reveal the structural information of a sample. To this end, the instrument needs to be in a vacuum to prevent electrons from scattering from gases and hinder the accumulation of contamination inside the microscope. Today, it is possible to keep a small part of the volume surrounding the sample under elevated pressure to perform high-pressure transmission electron microscopy. This technique allows scientists to study materials under realistic conditions, which is particularly relevant in catalysis. This chapter will review the main options for performing high-pressure transmission electron microscopy and underline what can be achieved by highlighting some examples from the literature." @default.
- W4377003539 created "2023-05-19" @default.
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- W4377003539 date "2023-01-01" @default.
- W4377003539 modified "2023-10-16" @default.
- W4377003539 title "High Pressure Transmission Electron Microscopy (TEM)" @default.
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- W4377003539 doi "https://doi.org/10.1007/978-3-031-07125-6_19" @default.
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