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- W4379356432 endingPage "109378" @default.
- W4379356432 startingPage "109378" @default.
- W4379356432 abstract "An electrode often gets hot as it is operated. However, the critical temperature to trigger its failure remains elusive. Using finite element simulations, we have shown that a silicon anode cracks with the increase of temperature. The critical temperature to initiate a crack is positively correlated to the thickness of the silicon film, while the crack density is on the contrary. The mechanism is attributed to the mismatch of material properties between the silicon film and its substrate. The dependency of damage rate on the thickness of silicon films is also discussed. The findings provide a guidance for designing an electrode with a better resistance to thermal load." @default.
- W4379356432 created "2023-06-05" @default.
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- W4379356432 date "2023-08-01" @default.
- W4379356432 modified "2023-10-16" @default.
- W4379356432 title "Size dependent thermal cracking of silicon anodes" @default.
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- W4379356432 doi "https://doi.org/10.1016/j.engfracmech.2023.109378" @default.
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