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• W4380520344 abstract "In this work, the impact of reverse conduction stress on the output current ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${I} _{D}$ </tex-math></inline-formula> ) instability in p-GaN gate HEMT are investigated. With more negative drain stress ( <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {DS}, text {str}}$ </tex-math></inline-formula> below −5 V), the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${I} _{D, text {max}}$ </tex-math></inline-formula> shows a positive shift in the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${I} _{D} - {V}_{text {DS}}$ </tex-math></inline-formula> measurement at <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {GS}}$ </tex-math></inline-formula> = 3 V and a negligible change at <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {GS}}$ </tex-math></inline-formula> = 5 V, meanwhile the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {TH}}$ </tex-math></inline-formula> shows a negative shift after the stress. By contrast, the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${I} _{D, text {max}}$ </tex-math></inline-formula> is basically unchanged with the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {DS}, text {str}}$ </tex-math></inline-formula> above −5 V. Through the simulation and extended experiments, it is found that the hole tunneling under the more negative <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${V} _{text {DS}, text {str}}$ </tex-math></inline-formula> and the subsequent hole accumulation and trapping within the gate stack dominate the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink> <tex-math notation=LaTeX>${I} _{D, text {max}}$ </tex-math></inline-formula> instability. The comparison of gate leakage and the transmission electron microscopy (TEM) observation before and after the stress further shows that the gate stack degenerates." @default.
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• W4380520344 date "2023-08-01" @default.
• W4380520344 modified "2023-09-24" @default.
• W4380520344 title "The <i>I_D </i> Instability Induced by Reverse Conduction Stress in p-GaN Gate HEMTs" @default.
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• W4380520344 doi "https://doi.org/10.1109/led.2023.3285527" @default.
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