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- W4380854477 abstract "This paper motivates the loss characterization and modeling of Class II multi-layer ceramic capacitors (MLCCs), which have been widely utilized owing to high energy density, in high-frequency resonant converters. In a resonant tank, MLCCs experience complex electrical operating conditions (e.g., large-signal, high-frequency, DC bias), but the incurred power loss has not been clearly characterized and modeled. This paper first proposes a novel resonant-Sawyer-Tower (Res-ST) circuit which can experimentally extracts the loss of a MLCC in real operation in a resonant tank. A general loss modeling approach named Steinmetz's Pre-electrified Graph (SPeG) is then proposed to correlate capacitor's loss to the peak value of excitation, frequency, and DC bias voltage. The SpeG model provides the material-specific volume loss density of common Class II dielectric materials and can be easily extrapolated to evaluate the loss of the MLCCs with different rated voltage <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink><tex-math notation=LaTeX>$&$</tex-math></inline-formula> capacitance but employing the same dielectric material. To generalize the material-specific SPeG model to device-level application, this paper also proposes an easy-to-follow tool, dielectric thickness observer (DTO), to estimate the internal microstructural geometry by tracking the <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink><tex-math notation=LaTeX>$C$</tex-math></inline-formula> - <inline-formula xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink><tex-math notation=LaTeX>$V$</tex-math></inline-formula> characteristic provided in product datasheet. The synergy of the proposed characterization circuit, SPeG loss model, and DTO establishes a toolkit that enables the estimation of MLCC losses in a manner similar to that of a ferromagnetic inductor/transformer core. This paper is accompanied by microscope images of the investigated MLCC samples and MATLAB scripts of the proposed DTO." @default.
- W4380854477 created "2023-06-16" @default.
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- W4380854477 date "2023-01-01" @default.
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- W4380854477 title "Loss Characterization and Modeling of Class II Multilayer Ceramic Capacitors: A Synergic Material-Microstructure-Device Approach" @default.
- W4380854477 doi "https://doi.org/10.1109/tpel.2023.3286818" @default.
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