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• W4381510294 endingPage "108699" @default.
• W4381510294 startingPage "108699" @default.
• W4381510294 abstract "In this paper the role of interface/border defects on the threshold voltage drift (ΔVTH) of SiC power MOSFETs has been investigated by means of slow and fast positive bias temperature instability (PBTI), hysteresis and conductance tests. Results have shown an opposite temperature (T) dependency based on the level of the applied gate bias (VG) and on the adopted stress technique. With VG > 30 V and a slow-PBTI procedure, the creation of new oxide defects and/or the charge trapping in deep states occurs, showing a positive T-dependency. On the contrary, with a lower VG and a fast-PBTI test, the ΔVTH shows a negative T-dependency, associated to dominant role of pre-existing interface and/or border traps." @default.
• W4381510294 created "2023-06-22" @default.
• W4381510294 creator A5017061102 @default.
• W4381510294 creator A5018760551 @default.
• W4381510294 creator A5040318538 @default.
• W4381510294 creator A5041741378 @default.
• W4381510294 creator A5043705906 @default.
• W4381510294 creator A5044187562 @default.
• W4381510294 creator A5061296378 @default.
• W4381510294 creator A5062495445 @default.
• W4381510294 date "2023-09-01" @default.
• W4381510294 modified "2023-10-02" @default.
• W4381510294 title "Role of interface/border traps on the threshold voltage instability of SiC power transistors" @default.
• W4381510294 cites W2171886847 @default.
• W4381510294 cites W2770666768 @default.
• W4381510294 cites W2771705811 @default.
• W4381510294 cites W2978403380 @default.
• W4381510294 cites W2984175522 @default.
• W4381510294 cites W3039915338 @default.
• W4381510294 cites W3103591937 @default.
• W4381510294 cites W3168819088 @default.
• W4381510294 cites W4220732307 @default.
• W4381510294 cites W4225299109 @default.
• W4381510294 cites W4226296963 @default.
• W4381510294 doi "https://doi.org/10.1016/j.sse.2023.108699" @default.
• W4381510294 hasPublicationYear "2023" @default.
• W4381510294 type Work @default.
• W4381510294 citedByCount "0" @default.
• W4381510294 crossrefType "journal-article" @default.
• W4381510294 hasAuthorship W4381510294A5017061102 @default.
• W4381510294 hasAuthorship W4381510294A5018760551 @default.
• W4381510294 hasAuthorship W4381510294A5040318538 @default.
• W4381510294 hasAuthorship W4381510294A5041741378 @default.
• W4381510294 hasAuthorship W4381510294A5043705906 @default.
• W4381510294 hasAuthorship W4381510294A5044187562 @default.
• W4381510294 hasAuthorship W4381510294A5061296378 @default.
• W4381510294 hasAuthorship W4381510294A5062495445 @default.
• W4381510294 hasConcept C115903868 @default.
• W4381510294 hasConcept C119599485 @default.
• W4381510294 hasConcept C121332964 @default.
• W4381510294 hasConcept C121932024 @default.
• W4381510294 hasConcept C123299182 @default.
• W4381510294 hasConcept C127413603 @default.
• W4381510294 hasConcept C138885662 @default.
• W4381510294 hasConcept C165801399 @default.
• W4381510294 hasConcept C172385210 @default.
• W4381510294 hasConcept C18903297 @default.
• W4381510294 hasConcept C191897082 @default.
• W4381510294 hasConcept C192562407 @default.
• W4381510294 hasConcept C195370968 @default.
• W4381510294 hasConcept C19768560 @default.
• W4381510294 hasConcept C207821765 @default.
• W4381510294 hasConcept C21036866 @default.
• W4381510294 hasConcept C26873012 @default.
• W4381510294 hasConcept C2777924906 @default.
• W4381510294 hasConcept C2779851234 @default.
• W4381510294 hasConcept C41008148 @default.
• W4381510294 hasConcept C41895202 @default.
• W4381510294 hasConcept C49040817 @default.
• W4381510294 hasConcept C557185 @default.
• W4381510294 hasConcept C57879066 @default.
• W4381510294 hasConcept C86803240 @default.
• W4381510294 hasConceptScore W4381510294C115903868 @default.
• W4381510294 hasConceptScore W4381510294C119599485 @default.
• W4381510294 hasConceptScore W4381510294C121332964 @default.
• W4381510294 hasConceptScore W4381510294C121932024 @default.
• W4381510294 hasConceptScore W4381510294C123299182 @default.
• W4381510294 hasConceptScore W4381510294C127413603 @default.
• W4381510294 hasConceptScore W4381510294C138885662 @default.
• W4381510294 hasConceptScore W4381510294C165801399 @default.
• W4381510294 hasConceptScore W4381510294C172385210 @default.
• W4381510294 hasConceptScore W4381510294C18903297 @default.
• W4381510294 hasConceptScore W4381510294C191897082 @default.
• W4381510294 hasConceptScore W4381510294C192562407 @default.
• W4381510294 hasConceptScore W4381510294C195370968 @default.
• W4381510294 hasConceptScore W4381510294C19768560 @default.
• W4381510294 hasConceptScore W4381510294C207821765 @default.
• W4381510294 hasConceptScore W4381510294C21036866 @default.
• W4381510294 hasConceptScore W4381510294C26873012 @default.
• W4381510294 hasConceptScore W4381510294C2777924906 @default.
• W4381510294 hasConceptScore W4381510294C2779851234 @default.
• W4381510294 hasConceptScore W4381510294C41008148 @default.
• W4381510294 hasConceptScore W4381510294C41895202 @default.
• W4381510294 hasConceptScore W4381510294C49040817 @default.
• W4381510294 hasConceptScore W4381510294C557185 @default.
• W4381510294 hasConceptScore W4381510294C57879066 @default.
• W4381510294 hasConceptScore W4381510294C86803240 @default.
• W4381510294 hasLocation W43815102941 @default.
• W4381510294 hasOpenAccess W4381510294 @default.
• W4381510294 hasPrimaryLocation W43815102941 @default.
• W4381510294 hasRelatedWork W1517134236 @default.
• W4381510294 hasRelatedWork W1967387685 @default.
• W4381510294 hasRelatedWork W1987465343 @default.
• W4381510294 hasRelatedWork W1996958856 @default.
• W4381510294 hasRelatedWork W2021137353 @default.
• W4381510294 hasRelatedWork W2081382200 @default.
• W4381510294 hasRelatedWork W2106270707 @default.
• W4381510294 hasRelatedWork W2113214786 @default.

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