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- W4382052013 abstract "Transmission electron microscopy (TEM) is widely used in the materials science community because of its high spatial, temporal and energy resolution. However, for electron beam-sensitive halide perovskites (HPs), the achievements offered by TEM are still in their infancy due to the nonnegligible structural damage caused by the incident electron beams to the fragile structure. Despite these challenges, the potential for TEM to provide unique insights into the microstructure and phase evolution of HPs at the atomic scale, to track the dynamic ion migration behaviors, and to explore the effects of lattice defects on physicochemical properties is still fascinating. In this review, we summarize recent achievements in HPs through advanced analytical methods embedded in the TEM, including high-resolution/scanning TEM (HRTEM/STEM) imaging, electron diffraction (ED) analysis, X-ray energy dispersive spectroscopy (EDS), and electron energy-loss spectroscopy (EELS) measurement, and in-situ TEM observation, with the aim of providing a multi-dimensional and multi-scale understanding of the intrinsic properties of HPs that have not yet been discovered. In addition, we delve into the inherent beam-damage mechanisms affecting the delicate HPs crystal, thereby emphasizing the significant hurdles associated with employing TEM in HPs research. Finally, we present a number of effective strategies that may be beneficial in reducing the damage caused by beams. In particular, the introduction of a direct-detection electron-counting (DDEC) camera has contributed significantly to the advancement of low-dose imaging and the suppression of beam damage to the intrinsic structure of HPs. With the improvement of low-dose imaging technology, TEM characterization is expected to promote a comprehensive understanding of the intrinsic properties of HPs in terms of structure-property-performance and to expand the wide range of applications of HPs in optoelectronic devices." @default.
- W4382052013 created "2023-06-27" @default.
- W4382052013 creator A5011885759 @default.
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- W4382052013 date "2023-06-01" @default.
- W4382052013 modified "2023-09-24" @default.
- W4382052013 title "Low-dose transmission electron microscopy study on halide perovskites: application and challenges" @default.
- W4382052013 cites W1876297499 @default.
- W4382052013 cites W1984689770 @default.
- W4382052013 cites W1985379711 @default.
- W4382052013 cites W1993858653 @default.
- W4382052013 cites W1999717631 @default.
- W4382052013 cites W2008087337 @default.
- W4382052013 cites W2008922772 @default.
- W4382052013 cites W2011266160 @default.
- W4382052013 cites W2014422745 @default.
- W4382052013 cites W2034217813 @default.
- W4382052013 cites W2041726686 @default.
- W4382052013 cites W2042511808 @default.
- W4382052013 cites W2057327293 @default.
- W4382052013 cites W2087642091 @default.
- W4382052013 cites W2093975870 @default.
- W4382052013 cites W2113276021 @default.
- W4382052013 cites W2116343274 @default.
- W4382052013 cites W2117274978 @default.
- W4382052013 cites W2139755213 @default.
- W4382052013 cites W2149360962 @default.
- W4382052013 cites W2161263580 @default.
- W4382052013 cites W2161603942 @default.
- W4382052013 cites W2167843206 @default.
- W4382052013 cites W2195844396 @default.
- W4382052013 cites W2260933961 @default.
- W4382052013 cites W2328455311 @default.
- W4382052013 cites W2341562469 @default.
- W4382052013 cites W2396261957 @default.
- W4382052013 cites W2396642634 @default.
- W4382052013 cites W2399861983 @default.
- W4382052013 cites W2463673634 @default.
- W4382052013 cites W2465428033 @default.
- W4382052013 cites W2471277370 @default.
- W4382052013 cites W2503146384 @default.
- W4382052013 cites W2521078012 @default.
- W4382052013 cites W2528629666 @default.
- W4382052013 cites W2530992228 @default.
- W4382052013 cites W2536338856 @default.
- W4382052013 cites W2537565595 @default.
- W4382052013 cites W2549727999 @default.
- W4382052013 cites W2564407156 @default.
- W4382052013 cites W2581455351 @default.
- W4382052013 cites W2590047498 @default.
- W4382052013 cites W2605298816 @default.
- W4382052013 cites W2620751275 @default.
- W4382052013 cites W2734305357 @default.
- W4382052013 cites W2742879839 @default.
- W4382052013 cites W2748578943 @default.
- W4382052013 cites W2753739393 @default.
- W4382052013 cites W2755294117 @default.
- W4382052013 cites W2768548508 @default.
- W4382052013 cites W2783895701 @default.
- W4382052013 cites W2785060548 @default.
- W4382052013 cites W2786560818 @default.
- W4382052013 cites W2799633139 @default.
- W4382052013 cites W2801212014 @default.
- W4382052013 cites W2801803040 @default.
- W4382052013 cites W2809379320 @default.
- W4382052013 cites W2884201468 @default.
- W4382052013 cites W2888358506 @default.
- W4382052013 cites W2889216396 @default.
- W4382052013 cites W2892470206 @default.
- W4382052013 cites W2895126220 @default.
- W4382052013 cites W2895207416 @default.
- W4382052013 cites W2895573231 @default.
- W4382052013 cites W2898712814 @default.
- W4382052013 cites W2899612677 @default.
- W4382052013 cites W2900653032 @default.
- W4382052013 cites W2907307316 @default.
- W4382052013 cites W2910387983 @default.
- W4382052013 cites W2912325502 @default.
- W4382052013 cites W2919043374 @default.
- W4382052013 cites W2924812138 @default.
- W4382052013 cites W2925164828 @default.
- W4382052013 cites W2932132667 @default.
- W4382052013 cites W2944169100 @default.
- W4382052013 cites W2946591934 @default.
- W4382052013 cites W2946688422 @default.
- W4382052013 cites W2947140612 @default.
- W4382052013 cites W2949664934 @default.
- W4382052013 cites W2969263347 @default.
- W4382052013 cites W2970856581 @default.
- W4382052013 cites W2988443684 @default.
- W4382052013 cites W2995055796 @default.
- W4382052013 cites W2998893995 @default.
- W4382052013 cites W2999734283 @default.