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- W4382371024 abstract "In this article, the reliability of planar, symmetrical, and asymmetrical trench SiC <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> s is analysed under repetitive short circuit impulses at 300 and 450 K. Both static and dynamic parameters are measured to characterize the degradation pattern of the three <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> structures. The degradation mechanisms are analyzed and the internal electro-thermal behavior of <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> s is revealed through TCAD models. It has been found out that there is minor degradation for planar SiC devices under both test conditions. The symmetrical trench SiC <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> has the lowest reliability, which fails after 200 and 80 cycles at room and elevated temperature. The asymmetrical trench SiC <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> has slightly higher reliability, failing after 1500 cycles and 500 cycles at room and elevated temperature, respectively. A comprehensive range of measurements until failure and the corresponding Silvaco TCAD analysis confirms that for both trench SiC <sc xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>mosfet</small> s, the deterioration of the gate oxide is responsible for the degradations and device failure. The higher the temperature, the higher electro-thermo-mechanical stress the devices suffer." @default.
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- W4382371024 date "2023-09-01" @default.
- W4382371024 modified "2023-09-29" @default.
- W4382371024 title "Degradation Analysis of Planar, Symmetrical and Asymmetrical Trench SiC MOSFETs Under Repetitive Short Circuit Impulses" @default.
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- W4382371024 doi "https://doi.org/10.1109/tpel.2023.3290387" @default.
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