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- W4382753816 endingPage "79" @default.
- W4382753816 startingPage "62" @default.
- W4382753816 abstract "In this study, commercially low-voltage MOVs are exposed to switching surges to analyse and model the relationship between the number of surges and the MOV grain barrier height response. Repeated slow-front overvoltage transients are used to degrade the protective qualities of metal oxide surge arrester devices, affecting their reliability and stability. A total of 360 MOVs with similar specifications from three different manufacturers are degraded under switching surges at a constant temperature of 60 °C. The reference voltage and C-V characteristics of MOVs are measured before and after the degradation process to analyse the MOVs’ conditions. Grain barrier heights are determined from the C-V characteristics curve. An F-statistical analysis is then applied to analyse the effects of number of surges on the grain barrier height. The T-test is used to assess the statistical difference between the tested groups. Linear regression analysis is then applied to model the relationship between the number of surges and MOV grain barrier height. The results obtained show that the number of surges has a significant impact on grain barrier height. MOV grain barrier height is found to decrease as the number of surges applied increases. Regression models obtained for the tested MOV groups across all three manufacturers agree and indicate that the reduction in grain barrier height results from an increased number of surges. Regression coefficients of a developed model indicate that for one surge applied, the MOV grain barrier height decreases by 0.024, 0.055, and 0.033 eV/cm for manufacturers X, Y, and Z, respectively. Therefore, there is a linear relationship between grain barrier height and the number of applied switching surges." @default.
- W4382753816 created "2023-07-01" @default.
- W4382753816 creator A5003859746 @default.
- W4382753816 creator A5007221900 @default.
- W4382753816 creator A5079866137 @default.
- W4382753816 date "2023-05-09" @default.
- W4382753816 modified "2023-09-28" @default.
- W4382753816 title "Modelling of Low-Voltage Varistors’ Responses under Slow-Front Overvoltages" @default.
- W4382753816 cites W1971386319 @default.
- W4382753816 cites W1980093131 @default.
- W4382753816 cites W2018318371 @default.
- W4382753816 cites W2030667451 @default.
- W4382753816 cites W2048694650 @default.
- W4382753816 cites W2088241994 @default.
- W4382753816 cites W2091068431 @default.
- W4382753816 cites W2100046572 @default.
- W4382753816 cites W2101417311 @default.
- W4382753816 cites W2109182090 @default.
- W4382753816 cites W2115678836 @default.
- W4382753816 cites W2132965330 @default.
- W4382753816 cites W2168173654 @default.
- W4382753816 cites W2171675993 @default.
- W4382753816 cites W2344675979 @default.
- W4382753816 cites W2402386366 @default.
- W4382753816 cites W2553707037 @default.
- W4382753816 cites W2912230694 @default.
- W4382753816 cites W2912619020 @default.
- W4382753816 cites W2934118928 @default.
- W4382753816 cites W3003578689 @default.
- W4382753816 cites W3033759984 @default.
- W4382753816 cites W3081062598 @default.
- W4382753816 cites W3109355298 @default.
- W4382753816 cites W3123398926 @default.
- W4382753816 cites W4249584193 @default.
- W4382753816 cites W4293257899 @default.
- W4382753816 doi "https://doi.org/10.3390/electronicmat4020006" @default.
- W4382753816 hasPublicationYear "2023" @default.
- W4382753816 type Work @default.
- W4382753816 citedByCount "0" @default.
- W4382753816 crossrefType "journal-article" @default.
- W4382753816 hasAuthorship W4382753816A5003859746 @default.
- W4382753816 hasAuthorship W4382753816A5007221900 @default.
- W4382753816 hasAuthorship W4382753816A5079866137 @default.
- W4382753816 hasBestOaLocation W43827538161 @default.
- W4382753816 hasConcept C119599485 @default.
- W4382753816 hasConcept C127413603 @default.
- W4382753816 hasConcept C154108245 @default.
- W4382753816 hasConcept C15703209 @default.
- W4382753816 hasConcept C159985019 @default.
- W4382753816 hasConcept C165801399 @default.
- W4382753816 hasConcept C192191005 @default.
- W4382753816 hasConcept C192562407 @default.
- W4382753816 hasConcept C58289394 @default.
- W4382753816 hasConceptScore W4382753816C119599485 @default.
- W4382753816 hasConceptScore W4382753816C127413603 @default.
- W4382753816 hasConceptScore W4382753816C154108245 @default.
- W4382753816 hasConceptScore W4382753816C15703209 @default.
- W4382753816 hasConceptScore W4382753816C159985019 @default.
- W4382753816 hasConceptScore W4382753816C165801399 @default.
- W4382753816 hasConceptScore W4382753816C192191005 @default.
- W4382753816 hasConceptScore W4382753816C192562407 @default.
- W4382753816 hasConceptScore W4382753816C58289394 @default.
- W4382753816 hasIssue "2" @default.
- W4382753816 hasLocation W43827538161 @default.
- W4382753816 hasOpenAccess W4382753816 @default.
- W4382753816 hasPrimaryLocation W43827538161 @default.
- W4382753816 hasRelatedWork W2034398614 @default.
- W4382753816 hasRelatedWork W2102731773 @default.
- W4382753816 hasRelatedWork W2125838291 @default.
- W4382753816 hasRelatedWork W2162326219 @default.
- W4382753816 hasRelatedWork W2177191119 @default.
- W4382753816 hasRelatedWork W2203043845 @default.
- W4382753816 hasRelatedWork W2389406450 @default.
- W4382753816 hasRelatedWork W2393602586 @default.
- W4382753816 hasRelatedWork W3143317651 @default.
- W4382753816 hasRelatedWork W2174130435 @default.
- W4382753816 hasVolume "4" @default.
- W4382753816 isParatext "false" @default.
- W4382753816 isRetracted "false" @default.
- W4382753816 workType "article" @default.