Matches in SemOpenAlex for { <https://semopenalex.org/work/W4383226494> ?p ?o ?g. }
- W4383226494 abstract "Developing high-performance infrared (IR) radiation materials with desired broadband emissivity, excellent thermal stability, and scalable fabrication processes is highly desirable for energy-saving applications and heat dissipation. However, it remains a grand challenge to concurrently meet these requirements in existing IR radiation materials. Herein, a high-entropy (HE) approach is employed to advance the IR radiation performance of spinel oxide. This strategy efficiently narrows the bandgap due to the enhanced electron transitions and the introduction of oxygen vacancies (Ov), variable-valence behavior, and orbital hybridization. In addition, the lattice distortion effect lowers the symmetry of lattice vibration. Therefore, the resulting HE spinel oxide exhibits near-blackbody radiation performance, with its emissivity approximately three times higher than that of the binary spinel oxide. Moreover, the entropy-dominating phase stabilization effect contributes to impressive thermal stability (stable at 1300 °C for 100 h). This makes it suitable for high-temperature thermal radiation applications, such as energy conservation in industrial high-temperature furnaces. More importantly, the HE spinel oxide can be readily spray-coated on various substrates. And the coating on stainless steel reaches an outstanding emissivity of 0.943 in the 0.78−16 µm wavelength range. All these merits render the HE approach competitive for the development of high-emissivity and thermally stable thermal radiation materials." @default.
- W4383226494 created "2023-07-06" @default.
- W4383226494 creator A5004911199 @default.
- W4383226494 creator A5005584095 @default.
- W4383226494 creator A5008917231 @default.
- W4383226494 creator A5015961049 @default.
- W4383226494 creator A5021129652 @default.
- W4383226494 creator A5041662861 @default.
- W4383226494 creator A5049475719 @default.
- W4383226494 creator A5058637832 @default.
- W4383226494 creator A5070792437 @default.
- W4383226494 creator A5078614383 @default.
- W4383226494 creator A5083469518 @default.
- W4383226494 date "2023-07-04" @default.
- W4383226494 modified "2023-09-27" @default.
- W4383226494 title "High‐Entropy Engineering for Broadband Infrared Radiation" @default.
- W4383226494 cites W1970014398 @default.
- W4383226494 cites W1999173631 @default.
- W4383226494 cites W2021640655 @default.
- W4383226494 cites W2040432202 @default.
- W4383226494 cites W2041649895 @default.
- W4383226494 cites W2056679899 @default.
- W4383226494 cites W2086388861 @default.
- W4383226494 cites W2091490877 @default.
- W4383226494 cites W2765274005 @default.
- W4383226494 cites W2770325309 @default.
- W4383226494 cites W2794133256 @default.
- W4383226494 cites W2894499460 @default.
- W4383226494 cites W2905339016 @default.
- W4383226494 cites W2932444974 @default.
- W4383226494 cites W2945485796 @default.
- W4383226494 cites W2948692802 @default.
- W4383226494 cites W2951539866 @default.
- W4383226494 cites W2992077554 @default.
- W4383226494 cites W2998085979 @default.
- W4383226494 cites W2998808169 @default.
- W4383226494 cites W3005830554 @default.
- W4383226494 cites W3022407056 @default.
- W4383226494 cites W3025916231 @default.
- W4383226494 cites W3044537023 @default.
- W4383226494 cites W3081108597 @default.
- W4383226494 cites W3092804540 @default.
- W4383226494 cites W3096925923 @default.
- W4383226494 cites W3121526599 @default.
- W4383226494 cites W3132908145 @default.
- W4383226494 cites W3148416643 @default.
- W4383226494 cites W3164133397 @default.
- W4383226494 cites W3172610549 @default.
- W4383226494 cites W3195607848 @default.
- W4383226494 cites W3196303774 @default.
- W4383226494 cites W3196379362 @default.
- W4383226494 cites W3196435264 @default.
- W4383226494 cites W3200910178 @default.
- W4383226494 cites W3203930961 @default.
- W4383226494 cites W3212428633 @default.
- W4383226494 cites W3213347357 @default.
- W4383226494 cites W3216246316 @default.
- W4383226494 cites W4200190480 @default.
- W4383226494 cites W4210732382 @default.
- W4383226494 cites W4221096362 @default.
- W4383226494 cites W4224034918 @default.
- W4383226494 cites W4224099868 @default.
- W4383226494 cites W4280588557 @default.
- W4383226494 cites W4281766857 @default.
- W4383226494 cites W4281779898 @default.
- W4383226494 cites W4294051862 @default.
- W4383226494 cites W4295852000 @default.
- W4383226494 cites W4297372110 @default.
- W4383226494 cites W4304127930 @default.
- W4383226494 cites W4306731671 @default.
- W4383226494 cites W4307309581 @default.
- W4383226494 cites W4307920675 @default.
- W4383226494 cites W4308741096 @default.
- W4383226494 cites W4310459544 @default.
- W4383226494 cites W4313647298 @default.
- W4383226494 cites W4315781455 @default.
- W4383226494 cites W4319773540 @default.
- W4383226494 cites W4319997268 @default.
- W4383226494 cites W834164233 @default.
- W4383226494 doi "https://doi.org/10.1002/adfm.202303197" @default.
- W4383226494 hasPublicationYear "2023" @default.
- W4383226494 type Work @default.
- W4383226494 citedByCount "0" @default.
- W4383226494 crossrefType "journal-article" @default.
- W4383226494 hasAuthorship W4383226494A5004911199 @default.
- W4383226494 hasAuthorship W4383226494A5005584095 @default.
- W4383226494 hasAuthorship W4383226494A5008917231 @default.
- W4383226494 hasAuthorship W4383226494A5015961049 @default.
- W4383226494 hasAuthorship W4383226494A5021129652 @default.
- W4383226494 hasAuthorship W4383226494A5041662861 @default.
- W4383226494 hasAuthorship W4383226494A5049475719 @default.
- W4383226494 hasAuthorship W4383226494A5058637832 @default.
- W4383226494 hasAuthorship W4383226494A5070792437 @default.
- W4383226494 hasAuthorship W4383226494A5078614383 @default.
- W4383226494 hasAuthorship W4383226494A5083469518 @default.
- W4383226494 hasConcept C120665830 @default.
- W4383226494 hasConcept C121332964 @default.
- W4383226494 hasConcept C127413603 @default.
- W4383226494 hasConcept C153385146 @default.
- W4383226494 hasConcept C157909335 @default.