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- W4383561821 abstract "The paper describes some problems of operation failures of integrated circuits (ICs) and corresponding preventative measures by constructive-technological, schematic-topological methods at the early stages of design process. The issues related to the problems of IC failures caused by dielectric breakdown are considered, generalized and systematized. Some examples that can be used in practice when developing ICs to improve their reliability, taking into account current trends in the microelectronics field." @default.
- W4383561821 created "2023-07-08" @default.
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- W4383561821 date "2023-04-02" @default.
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- W4383561821 title "Failures of ICs Caused by Dielectric Breakdown" @default.
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- W4383561821 doi "https://doi.org/10.55648/1998-6920-2023-17-2-69-83" @default.
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