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• W4384282254 endingPage "271" @default.
• W4384282254 startingPage "263" @default.
• W4384282254 abstract "From Bardeen's explanation of semiconductor surface states to the reliability challenges of ultrathin gate oxides of planar transistors to the Hot-carrier degradation challenge in self-heated FinFET (fin field-effect transistor) or GAA (gate all-around) transistors, the progress in Moore's law was made possible by discovering, quantifying, and addressing reliability challenges inherent in the successive generations of transistor technologies. In this article, we summarize some of the key reliability challenges and explain how their resolution at the material, device, circuit, system, and algorithm levels made Moore's law possible. New reliability issues will continue to emerge as we reach and go beyond the trillion-transistor integrated circuits and Gbit/s/mm communication speeds for 3D heterogeneously integrated circuits (ICs). A deep understanding of the historical context of a reliability-aware process, device, circuits, and system development, and the industry-wide collaboration needed to solve them, will guide our future efforts to sustain Moore's for the foreseeable future." @default.
• W4384282254 created "2023-07-15" @default.
• W4384282254 creator A5046235309 @default.
• W4384282254 creator A5053226693 @default.
• W4384282254 creator A5062601761 @default.
• W4384282254 date "2023-07-03" @default.
• W4384282254 modified "2023-10-14" @default.
• W4384282254 title "The Thin Film Transistor and Emergence of Large Area, Flexible Electronics and Beyond" @default.
• W4384282254 cites W1971562963 @default.
• W4384282254 cites W1999589524 @default.
• W4384282254 cites W2001850596 @default.
• W4384282254 cites W2011153946 @default.
• W4384282254 cites W2011427546 @default.
• W4384282254 cites W2014767498 @default.
• W4384282254 cites W2025029959 @default.
• W4384282254 cites W2037572878 @default.
• W4384282254 cites W2048921321 @default.
• W4384282254 cites W2064176178 @default.
• W4384282254 cites W2077356499 @default.
• W4384282254 cites W2091034024 @default.
• W4384282254 cites W2092884628 @default.
• W4384282254 cites W2100074107 @default.
• W4384282254 cites W2102394379 @default.
• W4384282254 cites W2105930789 @default.
• W4384282254 cites W2113940992 @default.
• W4384282254 cites W2117464810 @default.
• W4384282254 cites W2158799497 @default.
• W4384282254 cites W2160509435 @default.
• W4384282254 cites W2168646484 @default.
• W4384282254 cites W2170372777 @default.
• W4384282254 cites W2321501436 @default.
• W4384282254 cites W2329542580 @default.
• W4384282254 cites W2481547900 @default.
• W4384282254 cites W2503021987 @default.
• W4384282254 cites W2521286570 @default.
• W4384282254 cites W2538345477 @default.
• W4384282254 cites W2618073341 @default.
• W4384282254 cites W2726937775 @default.
• W4384282254 cites W2743371977 @default.
• W4384282254 cites W2808128092 @default.
• W4384282254 cites W2914862118 @default.
• W4384282254 cites W3030483807 @default.
• W4384282254 cites W3104030926 @default.
• W4384282254 cites W4214940538 @default.
• W4384282254 cites W4281255876 @default.
• W4384282254 cites W4293240634 @default.
• W4384282254 cites W4298120635 @default.
• W4384282254 doi "https://doi.org/10.1002/9781394202478.ch21" @default.
• W4384282254 hasPublicationYear "2023" @default.
• W4384282254 type Work @default.
• W4384282254 citedByCount "0" @default.
• W4384282254 crossrefType "other" @default.
• W4384282254 hasAuthorship W4384282254A5046235309 @default.
• W4384282254 hasAuthorship W4384282254A5053226693 @default.
• W4384282254 hasAuthorship W4384282254A5062601761 @default.
• W4384282254 hasConcept C111919701 @default.
• W4384282254 hasConcept C119599485 @default.
• W4384282254 hasConcept C121332964 @default.
• W4384282254 hasConcept C127413603 @default.
• W4384282254 hasConcept C134146338 @default.
• W4384282254 hasConcept C138331895 @default.
• W4384282254 hasConcept C151730666 @default.
• W4384282254 hasConcept C163258240 @default.
• W4384282254 hasConcept C165801399 @default.
• W4384282254 hasConcept C171250308 @default.
• W4384282254 hasConcept C172385210 @default.
• W4384282254 hasConcept C192562407 @default.
• W4384282254 hasConcept C206891323 @default.
• W4384282254 hasConcept C2779343474 @default.
• W4384282254 hasConcept C41008148 @default.
• W4384282254 hasConcept C43214815 @default.
• W4384282254 hasConcept C49040817 @default.
• W4384282254 hasConcept C530198007 @default.
• W4384282254 hasConcept C61696701 @default.
• W4384282254 hasConcept C62520636 @default.
• W4384282254 hasConcept C86803240 @default.
• W4384282254 hasConcept C98045186 @default.
• W4384282254 hasConceptScore W4384282254C111919701 @default.
• W4384282254 hasConceptScore W4384282254C119599485 @default.
• W4384282254 hasConceptScore W4384282254C121332964 @default.
• W4384282254 hasConceptScore W4384282254C127413603 @default.
• W4384282254 hasConceptScore W4384282254C134146338 @default.
• W4384282254 hasConceptScore W4384282254C138331895 @default.
• W4384282254 hasConceptScore W4384282254C151730666 @default.
• W4384282254 hasConceptScore W4384282254C163258240 @default.
• W4384282254 hasConceptScore W4384282254C165801399 @default.
• W4384282254 hasConceptScore W4384282254C171250308 @default.
• W4384282254 hasConceptScore W4384282254C172385210 @default.
• W4384282254 hasConceptScore W4384282254C192562407 @default.
• W4384282254 hasConceptScore W4384282254C206891323 @default.
• W4384282254 hasConceptScore W4384282254C2779343474 @default.
• W4384282254 hasConceptScore W4384282254C41008148 @default.
• W4384282254 hasConceptScore W4384282254C43214815 @default.
• W4384282254 hasConceptScore W4384282254C49040817 @default.
• W4384282254 hasConceptScore W4384282254C530198007 @default.
• W4384282254 hasConceptScore W4384282254C61696701 @default.
• W4384282254 hasConceptScore W4384282254C62520636 @default.
• W4384282254 hasConceptScore W4384282254C86803240 @default.

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