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- W4384305214 abstract "We demonstrate intensity autocorrelation techniques to directly characterize the pulse duration of hard x-ray free-electron laser (XFEL) pulses. A bottleneck for the realization of the technique is insufficient intensity of XFELs propagating through currently available autocorrelators, which employ silicon perfect crystals that work as a monochromator with a bandwidth of much narrower than typical XFEL bandwidths. Thanks to the self-seeding amplification mechanism, the spectral brightness of XFELs is increased and the XFEL intensity after the crystal-based autocorrelator reaches ~10 17 W/cm 2 at a micrometer-scale focal spot size, making the intensity autocorrelation techniques possible for hard x-ray lasers." @default.
- W4384305214 created "2023-07-15" @default.
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- W4384305214 date "2022-01-01" @default.
- W4384305214 modified "2023-09-23" @default.
- W4384305214 title "Direct Measurement of Hard X-Ray Laser Pulse Duration via Intensity Autocorrelation Techniques" @default.
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- W4384305214 doi "https://doi.org/10.1364/cleopr.2022.cwp19a_02" @default.
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