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• W4384916209 endingPage "75439" @default.
• W4384916209 startingPage "75434" @default.
• W4384916209 abstract "In this study, an experimental investigation was conducted to explore Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> Pb <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>y</sub> as a candidate material for temperature-sensing layers in uncooled microbolometers. RF and DC sputtering techniques were used to deposit Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> Pb <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>y</sub> thin films with various oxygen concentrations on silicon substrates at room temperature. The composition of the samples was experimentally analyzed using energy dispersive X-ray spectroscopy (EDX) that showed various oxygen concentrations. Atomic force microscopy (AFM) analysis showed excellent average surface roughness ranging from 0.6995 to 0.8660 nm. Increasing the concentration of oxygen up to 31% improved the thermoelectric and optical characteristics of the prepared Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>1-x</sub> Pb <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>x</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>y</sub> thin films. The highest temperature coefficient of resistance (TCR) of the fabricated samples was -3.85%/K for the Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.94</sub> Pb <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.06</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.31</sub> thin film. By using Essential McLeod software, optical simulation of the thin film samples was performed to assess the highest absorptance of the cavity microbolometer structure, which was 81.88% for the Ge <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.94</sub> Pb <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.06</sub> O <sub xmlns:mml=http://www.w3.org/1998/Math/MathML xmlns:xlink=http://www.w3.org/1999/xlink>0.31</sub> thin film." @default.
• W4384916209 created "2023-07-21" @default.
• W4384916209 creator A5005052604 @default.
• W4384916209 creator A5013939836 @default.
• W4384916209 creator A5024265693 @default.
• W4384916209 creator A5034359786 @default.
• W4384916209 creator A5066091278 @default.
• W4384916209 creator A5077865705 @default.
• W4384916209 date "2023-01-01" @default.
• W4384916209 modified "2023-09-30" @default.
• W4384916209 title "Optical and Temperature-Dependent Electrical Properties of Ge_1–xPb_xO_y Thin Films for Microbolometer Applications" @default.
• W4384916209 cites W2002493088 @default.
• W4384916209 cites W2008809862 @default.
• W4384916209 cites W2013653586 @default.
• W4384916209 cites W2083511681 @default.
• W4384916209 cites W2087924278 @default.
• W4384916209 cites W2105306878 @default.
• W4384916209 cites W2113474764 @default.
• W4384916209 cites W2125144377 @default.
• W4384916209 cites W2152260609 @default.
• W4384916209 cites W2617330400 @default.
• W4384916209 cites W2790866679 @default.
• W4384916209 cites W2886970041 @default.
• W4384916209 cites W2911321667 @default.
• W4384916209 cites W3195886980 @default.
• W4384916209 cites W5970799 @default.
• W4384916209 doi "https://doi.org/10.1109/access.2023.3297084" @default.
• W4384916209 hasPublicationYear "2023" @default.
• W4384916209 type Work @default.
• W4384916209 citedByCount "0" @default.
• W4384916209 crossrefType "journal-article" @default.
• W4384916209 hasAuthorship W4384916209A5005052604 @default.
• W4384916209 hasAuthorship W4384916209A5013939836 @default.
• W4384916209 hasAuthorship W4384916209A5024265693 @default.
• W4384916209 hasAuthorship W4384916209A5034359786 @default.
• W4384916209 hasAuthorship W4384916209A5066091278 @default.
• W4384916209 hasAuthorship W4384916209A5077865705 @default.
• W4384916209 hasBestOaLocation W43849162091 @default.
• W4384916209 hasConcept C113196181 @default.
• W4384916209 hasConcept C121332964 @default.
• W4384916209 hasConcept C178790620 @default.
• W4384916209 hasConcept C185592680 @default.
• W4384916209 hasConcept C192562407 @default.
• W4384916209 hasConceptScore W4384916209C113196181 @default.
• W4384916209 hasConceptScore W4384916209C121332964 @default.
• W4384916209 hasConceptScore W4384916209C178790620 @default.
• W4384916209 hasConceptScore W4384916209C185592680 @default.
• W4384916209 hasConceptScore W4384916209C192562407 @default.
• W4384916209 hasLocation W43849162091 @default.
• W4384916209 hasOpenAccess W4384916209 @default.
• W4384916209 hasPrimaryLocation W43849162091 @default.
• W4384916209 hasRelatedWork W2899084033 @default.
• W4384916209 hasRelatedWork W2902782467 @default.
• W4384916209 hasRelatedWork W2935759653 @default.
• W4384916209 hasRelatedWork W3105167352 @default.
• W4384916209 hasRelatedWork W3148032049 @default.
• W4384916209 hasRelatedWork W54078636 @default.
• W4384916209 hasRelatedWork W1501425562 @default.
• W4384916209 hasRelatedWork W2298861036 @default.
• W4384916209 hasRelatedWork W2954470139 @default.
• W4384916209 hasRelatedWork W3084825885 @default.
• W4384916209 hasVolume "11" @default.
• W4384916209 isParatext "false" @default.
• W4384916209 isRetracted "false" @default.
• W4384916209 workType "article" @default.