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- W4385071847 abstract "Journal Article Machine Vision Software Enables Normalization of Electron Dose Calibration Between Microscopes and Delivers Accurate Quantifiable Tracking of Electron Dose for In-Situ, Operando, and Dose Sensitive Experiments Get access Madeline Dressel Dukes, Madeline Dressel Dukes Protochips, Inc.Morrisville, NC, United States Corresponding author: madeline@protochips.com Search for other works by this author on: Oxford Academic Google Scholar Yaofeng Guo, Yaofeng Guo Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar Stamp Walden, Stamp Walden Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar Nynke Krans, Nynke Krans Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar Kate Marusak, Kate Marusak Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar Tim Eldred, Tim Eldred Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar John Damiano John Damiano Protochips, Inc.Morrisville, NC, United States Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 29, Issue Supplement_1, 1 August 2023, Pages 1849–1850, https://doi.org/10.1093/micmic/ozad067.955 Published: 22 July 2023" @default.
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- W4385071847 date "2023-07-22" @default.
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- W4385071847 title "Machine Vision Software Enables Normalization of Electron Dose Calibration Between Microscopes and Delivers Accurate Quantifiable Tracking of Electron Dose for In-Situ, Operando, and Dose Sensitive Experiments" @default.
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- W4385071847 doi "https://doi.org/10.1093/micmic/ozad067.955" @default.
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