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- W4386297373 abstract "Losses due to reflection of radiation off substrates and optical components often substantially inhibit the performance of detector and imaging systems. A novel means of enhancing transmission for improved detector and system performance involves the growth of nanostructured optical layers offering tunable refractive index properties, enabling broadband and omnidirectional suppression of light reflection/scattering while increasing transmission. These nanostructured antireflection (AR) coatings can be custom designed for specific wavebands from the ultraviolet (UV) to infrared (IR) for many potential optical applications, particularly when maximizing electro-optic and IR radiation transmission onto the surface of detectors is required to increase their sensitivity over various bands. The optimized AR nanostructured coatings were fabricated using a proprietary deposition process for high broadband AR performance. We have developed and advanced the AR coatings on GaSb, Si and various other substrate types particularly for IR band sensing applications. These nanostructured coatings provide substantial improvements over more conventional thin film AR coating technologies such as quarter wavelength stacks by further minimizing reflection losses and increasing transmission over a wide range of light incidence angles on optical detector and imaging devices. In this paper we review the latest developments in the high-performance nanoengineered AR coating technology for advancing NASA Earth Science sensing and imaging for various IR bands." @default.
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- W4386297373 date "2023-03-15" @default.
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- W4386297373 title "Advanced detector performance from UV to IR with nanostructured antireflection coatings" @default.
- W4386297373 doi "https://doi.org/10.1117/12.2656534" @default.
- W4386297373 hasPublicationYear "2023" @default.
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