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- W4386863599 abstract "This chapter gives an overview of the technology, principles of operation, status, and requirements for current EUV sources utilized in EUVL scanners and metrology applications. Due to the sheer number of topics covered in this text, the intent is to summarize the material then direct the reader to the corresponding volume for more detailed coverage. In this current publication, the scope is limited to laser-produced plasmas and discharge-produced plasmas with tin and xenon as target materials—both of which have been used in R&D and HVM-related sources. EUV source technology that may be used for the extension of EUVL via wavelength reduction (Blue-X) is also briefly covered." @default.
- W4386863599 created "2023-09-20" @default.
- W4386863599 creator A5086054409 @default.
- W4386863599 date "2023-09-19" @default.
- W4386863599 modified "2023-09-27" @default.
- W4386863599 title "Photon Source Technology for Lithography and Metrology: An Overview" @default.
- W4386863599 doi "https://doi.org/10.1117/3.2638242.ch1" @default.
- W4386863599 hasPublicationYear "2023" @default.
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