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• W4386934198 abstract "AbstractThis paper investigates the symbol error rate (SER) and coverage probability of single reconfigurable intelligent surface (S-RIS) and double reconfigurable intelligent surface (D-RIS) systems operating over Weibull fading channels. In the S-RIS system, the RIS is positioned between the base station and user link, while in the D-RIS system, RIS-1 and RIS-2 are placed near the base station and user respectively. By leveraging the central limit theorem, we derive the statistical parameters of the received signal-to-noise ratio (SNR) and subsequently closed-form expressions for SER and coverage probability of both systems using the moment-generating function. Also, we determine the optimal location of the RISs in D-RIS system from the simulations of SER. Comparative analysis reveals that the D-RIS system exhibits superior error performance and provides better coverage than the S-RIS system, despite having an equal number of reflecting elements. In addition, we provide an energy consumption gain analysis of the D-RIS system.KEYWORDS: Central limit theoremCoverage probabilityMoment generating functionReconfigurable intelligent surfaceSymbol error rateWeibull fading channel Disclosure statementNo potential conflict of interest was reported by the author(s).Availability of Data and MaterialData sharing is not applicable to this article as no datasets were generated during the current study.Additional informationFundingThe authors received no financial support for the research work.Notes on contributorsR. Mahammad RafiR Mahammad Rafi received his Btech degree in electronics and communication engineering from Jawaharlal Nehru Technological University, Anantapur, India, in 2013 and the Mtech degree in communications and signal processing from Jawaharlal Nehru Technological University, Anantapur, India, in 2016. He is currently working towards his PhD degree in National Institute of Technology (NIT), Tiruchirappalli, Tamil Nadu, India, from 2019. His research interests include mmWave communication, reconfigurable intelligent surface, and channel modeling. Corresponding author. Email: 408119011@nitt.edu.V. SudhaV Sudha received her BEdegree in electronics and communication engineering from Bharathidasan University, India, in 2000 and the ME degree in communication systems from Anna University, India, in 2006. She completed her PhD in the area of wireless communication systems at National Institute of Technology, Tiruchirappalli, in 2017. She has 22 years of teaching experience. Currently, she is working as an associate professor in the Department of Electronics and Communication Engineering, National Institute of Technology (NIT), Tiruchirappalli, India. Her research interests include multicarrier wireless systems, digital communication, wireless optical communication, and wireless networks. She has published several papers in international journals and conferences. She is a life member of ISTE. Email: vsudha@nitt.edu." @default.
• W4386934198 created "2023-09-22" @default.
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• W4386934198 date "2023-09-20" @default.
• W4386934198 modified "2023-10-16" @default.
• W4386934198 title "Double Reconfigurable Intelligent Surface to Improve Error Performance and Coverage Probability of Wireless Communication System" @default.
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• W4386934198 doi "https://doi.org/10.1080/03772063.2023.2258533" @default.
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