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- W4387415089 abstract "A high frequency S-matrix based measurement of complex permittivity with microstrip resonant ring (MRR) and coplanar waveguide (CPW) transmission line (TL) is developed. The permittivity characterization technique exploring the MRR resonance frequency and CPW TL insertion loss enables originally to consider the spatial distribution uniformity. The MRR is coupled with access TL and the CPW integrates hole and transition section to improve the transmission performance. The MRR and CPW parameter theoretical influences around 2-GHz and 10-GHz are examined from 3-D electromagnetic simulation. As proof-of-concept, different batches of domestic and RO4350B substrates are tested and compared. Due to the domestic substrate instability, the CPW and CPW physical parameter effects need to be compared by RO4350B substrate test. High-precision dielectric constant ε(x,y) and loss tangent tanδ(x,y) at 2-GHz and 10-GHz frequencies are measured with respect to the dielectric surface coordinates (x,y). The measured differences between ε(x,y) and tanδ(x,y) at various coordinate positions compared to the average values are assessed. The precision of dielectric constant testing can reach 0.004. The domestic substrate relative permittivity presents inhomogeneous property at the considered test frequencies." @default.
- W4387415089 created "2023-10-07" @default.
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- W4387415089 date "2023-01-01" @default.
- W4387415089 modified "2023-10-12" @default.
- W4387415089 title "Measurement of Substrate High Frequency Complex Dielectric Constant with 2-D Spatial Distribution" @default.
- W4387415089 doi "https://doi.org/10.1109/tim.2023.3322507" @default.
- W4387415089 hasPublicationYear "2023" @default.
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