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- W4387486504 abstract "Exploring ultrafast carrier dynamics is crucial for the materials' fundamental properties and device design. In this work, we employ time- and energy-resolved photoemission electron microscopy with tunable pump wavelengths from visible to near-infrared to reveal the ultrafast carrier dynamics of the elemental semiconductor tellurium. We find that two discrete sub-bands around the Γ point of the conduction band are involved in excited-state electron ultrafast relaxation and reveal that hot electrons first go through ultrafast intra sub-band cooling on a time scale of about 0.3 ps and then transfer from the higher sub-band to the lower one on a time scale of approximately 1 ps. Additionally, theoretical calculations reveal that the lower one has flat-band characteristics, possessing a large density of states and a long electron lifetime. Our work demonstrates that TR- and ER-PEEM with broad tunable pump wavelengths are powerful techniques in revealing the details of ultrafast carrier dynamics in time and energy domains." @default.
- W4387486504 created "2023-10-11" @default.
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- W4387486504 date "2023-10-10" @default.
- W4387486504 modified "2023-10-16" @default.
- W4387486504 title "Reveal Ultrafast Electron Relaxation across Sub-bands of Tellurium by Time- and Energy-Resolved Photoemission Microscopy" @default.
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- W4387486504 doi "https://doi.org/10.1021/acs.nanolett.3c03102" @default.
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