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• W49407679 abstract "A method to obtain a static Debye-Waller factor from a section topograph is described. The static Debye-Waller factor represents the average lattice distortion, and so it can be used to characterize defects smaller than x-ray topographic resolution. Section topography of extremely high-order reflection using synchrotron radiation has been applied to MCZ-Si crystals annealed at low temperatures, and the number density and the size of the oxygen precipitates have been estimated. The advantages of the section topography of high-order reflection are discussed." @default.
• W49407679 created "2016-06-24" @default.
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• W49407679 date "1990-01-01" @default.
• W49407679 modified "2023-09-27" @default.
• W49407679 title "CHARACTERIZATION OF MICRO-DEFECTS IN NEARLY PERFECT CRYSTALS BY ANALYZING THE PENDELLÖSUNG FRINGES IN THE SECTION TOPOGRAPHS OF HIGH-ORDER REFLECTIONS" @default.
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• W49407679 doi "https://doi.org/10.1016/b978-0-444-88429-9.50091-4" @default.
• W49407679 hasPublicationYear "1990" @default.
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