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- W51101579 abstract "An overview of the problem of go/no-go testing for parametric faults in analog integrated circuits is given. In a linear model that includes both test stimulus and measurement errors, the influence of such errors on the test decision is analyzed in order to calculate trade-off curves for the probabilities of misclassification. This is achieved by an optimization of the correlation between test and performance." @default.
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- W51101579 date "2003-01-01" @default.
- W51101579 modified "2023-10-17" @default.
- W51101579 title "On Parametric Test Design for Analog Integrated Circuits considering Error in Measurement and Stimulus" @default.
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- W51101579 doi "https://doi.org/10.1007/978-3-0348-8065-7_18" @default.
- W51101579 hasPublicationYear "2003" @default.
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