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• W58671468 abstract "The status of 3DXRD microscopy is reviewed, with a special view to applications in metallurgy. Various approaches are compared in terms of performance. In addition several recent advances are presented, such as a 3D grain map with an unprecedented spatial resolution of 500 nm, first results from the commissioning of a novel 3D detector set-up and a validation of the box-scan procedure. Three-Dimensional X-Ray Diffraction (3DXRD) is a novel technique, aiming at a fast and nondestructive characterization of the individual crystalline elements within mm-sized polycrystalline specimens. It is based on two principles: the use of highly penetrating hard X-rays from a synchrotron source (x-ray energies in the range 20-100 keV) and the application of 'tomographic' reconstruction algorithms for the analysis of the diffraction data. In favourable cases, the position, morphology, phase, and crystallographic orientation can be derived for hundreds of elements simultaneously as well as their elastic strains. Furthermore, the dynamics of the individual elements can be monitored during typical processes such as deformation or annealing. Hence, for the first time information on the interaction between elements can be obtained directly. The provision of such data is vital in order to extend beyond state-of-art structural models." @default.
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• W58671468 date "2010-01-01" @default.
• W58671468 modified "2023-10-18" @default.
• W58671468 title "4D CHARACTERIZATION OF METALS BY 3DXRD" @default.
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