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- W58705690 abstract "Sandia and Rontec GmbH have developed an annular, 12-element, 60 mm, Peltier-cooled, translatable, Silicon Drift Detector that we call the SDD-12. The body of the SDD-12 is 22.5 mm in total thickness and easily fits between the sample and the upstream wall of the Sandia microbeam chamber. At a working distance of 1mm, the solid angle is 1.09 sr. The energy resolution is 170eV at count rates <40 Kcps, and 200eV for rates of 1Mcps. X-ray count rates must be maintained below 50Kcps when protons are allowed to strike the full area of the SDD. Another innovation with this new μPIXE system is that the data are analyzed using Sandia’s Automated eXpert Spectral Image Analysis or AXSIA." @default.
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- W58705690 date "2004-06-01" @default.
- W58705690 modified "2023-09-26" @default.
- W58705690 title "The new annular Si drift detector uPIXE system at Sandia." @default.
- W58705690 hasPublicationYear "2004" @default.
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