FRINK Linked Data Fragments server

Matches in SemOpenAlex for { <https://semopenalex.org/work/W601174568> ?p ?o ?g. }

• W601174568 abstract "With a great growing use of electronic products in many aspects of society, it is evident that these products must perform reliably. Their reliability depends on the testing whether or not they have been manufactured properly and behave correctly. To ease testing, digital systems are commonly designed with Built-In Self Test facility. For this reason, development of test pattern for BIST based on combination of Linear Feedback Shift Register (LFSR) and deterministic ATPG (DATPG) approach could provide more solutions, such as reduce testing time, high fault coverage and low area overhead. One of the key challenges in BIST is the design of the Test Pattern Generation (TPG) that promised high fault coverage. The test pattern generation can be generated either manually or automatically. Problems related to ATPG are linked to the controllability and observability of the nodes in circuits. As far as the single stuck-at fault model is considered, efficient algorithms have been devised for combinational circuit. To illustrate that, the DATPG algorithm for digital combinational circuit using VHDL language is designed to generate the test patterns. Altera Max+plus II software is used to simulate the DATPG design to achieve the minimum test patterns for digital combinational circuit. The simulation result will be presented in the form of waveform.The results of DATPG for digital combinational circuit show that the sequence of LFSR has been reduced significantly. In BIST application, the minimum test patterns are applied to the adder/subtractor (A/S) known as circuit under test (CUT). A parallel A/S is chosen as a CUT due to the simplicity of the circuit architecture. The A/S is used to verify the proposed DATPG performance. Only one basic cell of the parallel A/S is required to determine the test pattern by considering the data flow from one cell to another. Identical test data can then be applied to both A/S inputs simultaneously. By reducing the number of test pattern, the testing time to market and manufacturing time is expected to reduce leading to reduction in the product cost." @default.
• W601174568 created "2016-06-24" @default.
• W601174568 creator A5049950578 @default.
• W601174568 creator A5074437075 @default.
• W601174568 date "2006-03-01" @default.
• W601174568 modified "2023-09-27" @default.
• W601174568 title "Deterministic Automatic Test Pattern Generation for Built-In Self Test System" @default.
• W601174568 hasPublicationYear "2006" @default.
• W601174568 type Work @default.
• W601174568 sameAs 601174568 @default.
• W601174568 citedByCount "0" @default.
• W601174568 crossrefType "dissertation" @default.
• W601174568 hasAuthorship W601174568A5049950578 @default.
• W601174568 hasAuthorship W601174568A5074437075 @default.
• W601174568 hasConcept C113775141 @default.
• W601174568 hasConcept C11413529 @default.
• W601174568 hasConcept C119599485 @default.
• W601174568 hasConcept C126953365 @default.
• W601174568 hasConcept C127313418 @default.
• W601174568 hasConcept C127413603 @default.
• W601174568 hasConcept C131017901 @default.
• W601174568 hasConcept C134146338 @default.
• W601174568 hasConcept C149635348 @default.
• W601174568 hasConcept C164620267 @default.
• W601174568 hasConcept C165205528 @default.
• W601174568 hasConcept C175551986 @default.
• W601174568 hasConcept C17626397 @default.
• W601174568 hasConcept C187805909 @default.
• W601174568 hasConcept C199360897 @default.
• W601174568 hasConcept C24326235 @default.
• W601174568 hasConcept C2777904410 @default.
• W601174568 hasConcept C2780980493 @default.
• W601174568 hasConcept C28826006 @default.
• W601174568 hasConcept C29652920 @default.
• W601174568 hasConcept C33923547 @default.
• W601174568 hasConcept C36299963 @default.
• W601174568 hasConcept C36941000 @default.
• W601174568 hasConcept C41008148 @default.
• W601174568 hasConcept C42935608 @default.
• W601174568 hasConcept C46362747 @default.
• W601174568 hasConcept C48209547 @default.
• W601174568 hasConcept C49654631 @default.
• W601174568 hasConcept C53942775 @default.
• W601174568 hasConcept C81409106 @default.
• W601174568 hasConcept C81843906 @default.
• W601174568 hasConceptScore W601174568C113775141 @default.
• W601174568 hasConceptScore W601174568C11413529 @default.
• W601174568 hasConceptScore W601174568C119599485 @default.
• W601174568 hasConceptScore W601174568C126953365 @default.
• W601174568 hasConceptScore W601174568C127313418 @default.
• W601174568 hasConceptScore W601174568C127413603 @default.
• W601174568 hasConceptScore W601174568C131017901 @default.
• W601174568 hasConceptScore W601174568C134146338 @default.
• W601174568 hasConceptScore W601174568C149635348 @default.
• W601174568 hasConceptScore W601174568C164620267 @default.
• W601174568 hasConceptScore W601174568C165205528 @default.
• W601174568 hasConceptScore W601174568C175551986 @default.
• W601174568 hasConceptScore W601174568C17626397 @default.
• W601174568 hasConceptScore W601174568C187805909 @default.
• W601174568 hasConceptScore W601174568C199360897 @default.
• W601174568 hasConceptScore W601174568C24326235 @default.
• W601174568 hasConceptScore W601174568C2777904410 @default.
• W601174568 hasConceptScore W601174568C2780980493 @default.
• W601174568 hasConceptScore W601174568C28826006 @default.
• W601174568 hasConceptScore W601174568C29652920 @default.
• W601174568 hasConceptScore W601174568C33923547 @default.
• W601174568 hasConceptScore W601174568C36299963 @default.
• W601174568 hasConceptScore W601174568C36941000 @default.
• W601174568 hasConceptScore W601174568C41008148 @default.
• W601174568 hasConceptScore W601174568C42935608 @default.
• W601174568 hasConceptScore W601174568C46362747 @default.
• W601174568 hasConceptScore W601174568C48209547 @default.
• W601174568 hasConceptScore W601174568C49654631 @default.
• W601174568 hasConceptScore W601174568C53942775 @default.
• W601174568 hasConceptScore W601174568C81409106 @default.
• W601174568 hasConceptScore W601174568C81843906 @default.
• W601174568 hasLocation W6011745681 @default.
• W601174568 hasOpenAccess W601174568 @default.
• W601174568 hasPrimaryLocation W6011745681 @default.
• W601174568 hasRelatedWork W1974135910 @default.
• W601174568 hasRelatedWork W2103050772 @default.
• W601174568 hasRelatedWork W2148015755 @default.
• W601174568 hasRelatedWork W2155004241 @default.
• W601174568 hasRelatedWork W2165132030 @default.
• W601174568 hasRelatedWork W2171185508 @default.
• W601174568 hasRelatedWork W2261595744 @default.
• W601174568 hasRelatedWork W2338801595 @default.
• W601174568 hasRelatedWork W2550725449 @default.
• W601174568 hasRelatedWork W2552184426 @default.
• W601174568 hasRelatedWork W2563510539 @default.
• W601174568 hasRelatedWork W2724679431 @default.
• W601174568 hasRelatedWork W2940545572 @default.
• W601174568 hasRelatedWork W3114506914 @default.
• W601174568 hasRelatedWork W646944990 @default.
• W601174568 hasRelatedWork W776711554 @default.
• W601174568 hasRelatedWork W1232298525 @default.
• W601174568 hasRelatedWork W2137702935 @default.
• W601174568 hasRelatedWork W2183965990 @default.
• W601174568 hasRelatedWork W2789062627 @default.
• W601174568 isParatext "false" @default.

• next