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• W613791178 abstract "F. Kurayama, N. Suzuki, M. Sato, T. Furusawa, H. Isahara, Y. Kikuchi, S. Fukushima, M. Takano, E. Iwase, R. Inoue, M. Sato, and T. Itoh Utsunomiya University, Yoto 7-1-2, Utsunomiya 321-8585, Japan National Institute for Materials Science, 1-2-1 sengen, Tsukuba 305-0047, Japan Panasonic Electronic Devices Co.,Ltd., 1006 Kadoma, Kadoma 571-8506, Japan Asahi Kasei Corporation, 2-1 Samejima,Fuji 416-8501, Japan ULVAC-PHI, Inc, 370 Enzo, Chigasaki 253-8522, Japan Mitsubishi Materials Co., 1-297, Kitabukuro, Omiya-ku, Saitama 330-0835, Japan suzukin@cc.utsunomiya-u.ac.jp" @default.
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• W613791178 date "2009-01-01" @default.
• W613791178 modified "2023-09-23" @default.
• W613791178 title "Round Robin Test for the Quantification and Standardization of Sample Damage during XPS Measurements" @default.
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• W613791178 doi "https://doi.org/10.1384/jsa.16.2" @default.
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