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- W6576197 abstract "AbstractReducing the power consumption of digital designs through the use of more than one Vdd value (multivoltage) is known and well practiced. Some manufacturing defects have Vdd dependency, which implies that defects can become active only at certain power supply setting, leading to reduced defect coverage. This chapter presents a coherent overview of recently reported research in testing strategies for multivoltage designs including defect modeling, test generation, and DFT solutions. The chapter also outlines number of worthy research problems that need to be addressed to develop high-quality and cost-effective test solutions for multi-Vdd designs.KeywordsSupply VoltageTest PatternDefect CoverageSoft ErrorOpen DefectThese keywords were added by machine and not by the authors. This process is experimental and the keywords may be updated as the learning algorithm improves." @default.
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- W6576197 date "2009-08-13" @default.
- W6576197 modified "2023-09-24" @default.
- W6576197 title "Test Strategies for Multivoltage Designs" @default.
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- W6576197 doi "https://doi.org/10.1007/978-1-4419-0928-2_8" @default.
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