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- W744580022 abstract "Process changes iterated under guidance of x-radiography. In recent work at NASA Lewis Research Center, density gradients in sintered silicon nitride, characterized by x-radiography, identified and appeared strongly dependent upon powder-processing and sintering conditions. NASA technical memorandum describes systematic investigation, based upon preliminary work, of density-gradient/flexural-strength relationships as affected by processing." @default.
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- W744580022 date "1988-01-01" @default.
- W744580022 modified "2023-09-23" @default.
- W744580022 title "Optimization of Processing of Si3N4" @default.
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