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- W751310916 abstract "Fifteen years ago, the Epstein frame to the independent Single Sheet Tester (SST92) relation was determined using a large number of correlated grain-oriented samples [1], and the results are reflected in Annex C of IEC standard 60404-3 [2]. Whilst those results were achieved using the same equipment of one reference laboratory, the new data originate from measurements on sample pairs from different manufactures using their own measuring equipment. The resulting Epstein to SST92 ratios show slightly higher values than the old ones, and a considerable dispersion. The reasons for these phenomena are discussed and further experiments for their clarification proposed. Streszczenie. Pietnaście lat temu zaprezentowano porownanie wynikow badan roznych probek blach elektrotechnicznych wykonanych metoda Epsteina i przy wykorzystaniu testera probek arkuszowych SST92. Wyniki pochodzily z badania probek w tym samym laboratorium. Nowe wyniki zaprezentowane w pracy przedstawiają badania roznych probek w roznych laboratoriach. Otrzymano nieco wiekszy rozrzut zmierzonych wartości. W artykule analizuje sie przyczyny tych roznic. (Nowe badania relacji miedzy wynikami pomiarow metodą Epsteina a metodą testera probek arkuszowych SST)" @default.
- W751310916 created "2016-06-24" @default.
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- W751310916 date "2013-01-01" @default.
- W751310916 modified "2023-09-27" @default.
- W751310916 title "New Data on the Epstein to Single Sheet Tester Relationship" @default.
- W751310916 cites W1619238098 @default.
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