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• W768851902 abstract "Polycrystalline CoFe2O4 thin films were deposited on Si (100) substrates by chemical solution deposition with and without magnetic annealing. Magnetic field directions were applied parallel and perpendicular to the film surface during the magnetic annealing process. The variations of strain, microstructure and magnetic anisotropy of the films caused by the magnetic annealing are investigated. The results show that the film densification is promoted and grain morphology is changed by the magnetic annealing, which can be attributed to the promoting effect of magnetization force on the grain growing and grain boundary diffusing. Magnetic measurements indicate the enhancement of anisotropy and saturation magnetizations of the polycrystalline CoFe2O4 after magnetic annealing. Furthermore, the rotation of easy axis along the field direction, the increased occupation of Co2+ ions at B sites and the additional strain induced by the magnetic field are considered as the main reasons of the increased magnetic anisotropy." @default.
• W768851902 created "2016-06-24" @default.
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• W768851902 date "2015-11-01" @default.
• W768851902 modified "2023-10-15" @default.
• W768851902 title "Magnetism of CoFe2O4 thin films annealed under the magnetic field" @default.
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• W768851902 doi "https://doi.org/10.1016/j.jmmm.2015.06.089" @default.
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